An electron microscopy three-dimensional characterization of titania nanotubes.

3D structure FIB sectioning electron tomography titania nanotubes

Journal

Microscopy research and technique
ISSN: 1097-0029
Titre abrégé: Microsc Res Tech
Pays: United States
ID NLM: 9203012

Informations de publication

Date de publication:
Mar 2019
Historique:
received: 30 01 2018
revised: 21 05 2018
accepted: 19 06 2018
pubmed: 9 10 2018
medline: 9 10 2018
entrez: 9 10 2018
Statut: ppublish

Résumé

To characterize complex, three-dimensional nanostructures, modern microscopy techniques are needed, such as electron tomography and focused ion beam (FIB) sectioning. The aim of this study was to apply these two techniques to characterize TiO

Identifiants

pubmed: 30295363
doi: 10.1002/jemt.23093
doi:

Types de publication

Journal Article

Langues

eng

Pagination

173-177

Subventions

Organisme : The National Science Centre
ID : UMO-2014/13/D/ST8/03224

Informations de copyright

© 2018 Wiley Periodicals, Inc.

Auteurs

Mariusz Andrzejczuk (M)

Faculty of Materials Science and Engineering, Warsaw University of Technology, Warsaw, Poland.

Marcin Rasiński (M)

Forschungszentrum Jülich GmbH, Institut für Energie- und Klimaforschung - Plasmaphysik, Partner of the Trilateral Euregio Cluster (TEC), Jülich, Germany.

Agata Roguska (A)

Institute of Physical Chemistry, Polish Academy of Sciences, Warsaw, Poland.

Marcin Pisarek (M)

Institute of Physical Chemistry, Polish Academy of Sciences, Warsaw, Poland.

Malgorzata Lewandowska (M)

Faculty of Materials Science and Engineering, Warsaw University of Technology, Warsaw, Poland.

Classifications MeSH