Ti-Based Catalysts and Photocatalysts: Characterization and Modeling.
DFT
ETS-10; X-ray techniques
TiO2 photocatalyst
Titanium-silicalite-1
post Hartree-Fock methods
Journal
Chemical record (New York, N.Y.)
ISSN: 1528-0691
Titre abrégé: Chem Rec
Pays: United States
ID NLM: 101085550
Informations de publication
Date de publication:
Jul 2019
Jul 2019
Historique:
received:
21
07
2018
revised:
14
11
2018
pubmed:
21
12
2018
medline:
21
12
2018
entrez:
21
12
2018
Statut:
ppublish
Résumé
This perspective article aims to underline how cutting-edge synchrotron radiation spectroscopies such as extended X-ray absorption spectroscopy (EXAFS), X-ray absorption near edge structure (XANES), high resolution fluorescence detected (HRFD) XANES, X-ray emission spectroscopy (XES) and resonant inelastic X-ray scattering (RIXS) have played a key role in the structural and electronic characterization of Ti-based catalysts and photocatalysts, representing an important additional value to the outcomes of conventional laboratory spectroscopies (UV-Vis, IR, Raman, EPR, NMR etc.). Selected examples are taken from the authors research activity in the last two decades, covering both band-gap and shape engineered TiO
Identifiants
pubmed: 30570210
doi: 10.1002/tcr.201800108
doi:
Types de publication
Journal Article
Review
Langues
eng
Sous-ensembles de citation
IM
Pagination
1319-1336Subventions
Organisme : Evonik Resource Efficiency
Organisme : Russian Federation Government
Organisme : Southern Federal University
ID : 14.Y26.31.0001
Informations de copyright
© 2019 The Chemical Society of Japan & Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.