Monitoring selective etching of self-assembled nanostructured a-Si:Al films.


Journal

Nanotechnology
ISSN: 1361-6528
Titre abrégé: Nanotechnology
Pays: England
ID NLM: 101241272

Informations de publication

Date de publication:
29 Mar 2019
Historique:
pubmed: 3 1 2019
medline: 3 1 2019
entrez: 3 1 2019
Statut: ppublish

Résumé

Nanoporous and nanowire structures based on silicon (Si) have a well recognized potential in a number of applications such as photovoltaics, energy storage and thermoelectricity. The immiscibility of Si and aluminum (Al) may be utilized to produce a thin film of vertically aligned Al nanowires of 5 nm diameter within an amorphous silicon matrix (a-Si), providing a cheap and scalable fabrication method for sub 5 nm size Si nanostructures. In this work we study functionalization of these structures by removal of the Al nanowires. The nanowires have been etched by an aqueous solution of HCl, which results in a structure of vertically aligned nanochannels in a-Si with admixture of SiO

Identifiants

pubmed: 30602142
doi: 10.1088/1361-6528/aafb86
doi:

Types de publication

Journal Article

Langues

eng

Pagination

135601

Auteurs

T Kjeldstad (T)

Department of Physics/Centre for Materials Science and Nanotechnology, University of Oslo, PO Box 1048 Blindern, NO-0316 Oslo, Norway.

Classifications MeSH