Sensitive determination of silicon contents in low-alloy steels using micro laser-induced breakdown spectroscopy assisted with laser-induced fluorescence.

Laser-induced breakdown spectroscopy Laser-induced fluorescence Silicon Steel

Journal

Talanta
ISSN: 1873-3573
Titre abrégé: Talanta
Pays: Netherlands
ID NLM: 2984816R

Informations de publication

Date de publication:
01 Mar 2019
Historique:
received: 05 09 2018
revised: 18 10 2018
accepted: 19 10 2018
entrez: 6 1 2019
pubmed: 6 1 2019
medline: 6 1 2019
Statut: ppublish

Résumé

Silicon element plays an important role in strength and hardness improvement in steels, but is harmful for ductility, tenacity, and anti-corrosion. Therefore, silicon content should be fast determined in steel manufacture to keep silicon in moderation. In this work, micro laser-induced breakdown spectroscopy assisted with laser-induced fluorescence (μLIBS-LIF) was proposed to sensitively determine silicon in low-alloy steels. The mechanism and excitation selection of laser-induced silicon atomic fluorescence in laser-induced plasma were discussed. Under 10 µm laser-ablated scatters, the results showed that μLIBS-LIF had analytical performance with R

Identifiants

pubmed: 30609592
pii: S0039-9140(18)31109-3
doi: 10.1016/j.talanta.2018.10.069
pii:
doi:

Types de publication

Journal Article

Langues

eng

Pagination

697-702

Informations de copyright

Copyright © 2018 Elsevier B.V. All rights reserved.

Auteurs

Jiaming Li (J)

Guangzhou Key Laboratory for Special Fiber Photonic Devices, South China Normal University, Guangzhou 510631, China; Guangdong Provincial Key Laboratory of Nanophotonic Functional Materials and Devices, South China Normal University, Guangzhou 510631, China.

Manling Xu (M)

Guangzhou Key Laboratory for Special Fiber Photonic Devices, South China Normal University, Guangzhou 510631, China; Guangdong Provincial Key Laboratory of Nanophotonic Functional Materials and Devices, South China Normal University, Guangzhou 510631, China.

Qiongxiong Ma (Q)

Guangzhou Key Laboratory for Special Fiber Photonic Devices, South China Normal University, Guangzhou 510631, China; Guangdong Provincial Key Laboratory of Nanophotonic Functional Materials and Devices, South China Normal University, Guangzhou 510631, China.

Nan Zhao (N)

Guangzhou Key Laboratory for Special Fiber Photonic Devices, South China Normal University, Guangzhou 510631, China; Guangdong Provincial Key Laboratory of Nanophotonic Functional Materials and Devices, South China Normal University, Guangzhou 510631, China. Electronic address: zhaonan@m.scnu.edu.cn.

Xiangyou Li (X)

Wuhan National Laboratory for Optoelectronics (WNLO), Huazhong University of Science and Technology, Wuhan 430074, China.

Qingmao Zhang (Q)

Guangzhou Key Laboratory for Special Fiber Photonic Devices, South China Normal University, Guangzhou 510631, China; Guangdong Provincial Key Laboratory of Nanophotonic Functional Materials and Devices, South China Normal University, Guangzhou 510631, China.

Liang Guo (L)

Guangzhou Key Laboratory for Special Fiber Photonic Devices, South China Normal University, Guangzhou 510631, China; Guangdong Provincial Key Laboratory of Nanophotonic Functional Materials and Devices, South China Normal University, Guangzhou 510631, China.

Yongfeng Lu (Y)

Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, Lincoln, NE 68588-0511, USA.

Classifications MeSH