Ultra-high on-chip optical gain in erbium-based hybrid slot waveguides.


Journal

Nature communications
ISSN: 2041-1723
Titre abrégé: Nat Commun
Pays: England
ID NLM: 101528555

Informations de publication

Date de publication:
25 01 2019
Historique:
received: 15 02 2018
accepted: 29 12 2018
entrez: 27 1 2019
pubmed: 27 1 2019
medline: 27 1 2019
Statut: epublish

Résumé

Efficient and reliable on-chip optical amplifiers and light sources would enable versatile integration of various active functionalities on the silicon platform. Although lasing on silicon has been demonstrated with semiconductors by using methods such as wafer bonding or molecular beam epitaxy, cost-effective mass production methods for CMOS-compatible active devices are still lacking. Here, we report ultra-high on-chip optical gain in erbium-based hybrid slot waveguides with a monolithic, CMOS-compatible and scalable atomic-layer deposition process. The unique layer-by-layer nature of atomic-layer deposition enables atomic scale engineering of the gain layer properties and straightforward integration with silicon integrated waveguides. We demonstrate up to 20.1 ± 7.31 dB/cm and at least 52.4 ± 13.8 dB/cm net modal and material gain per unit length, respectively, the highest performance achieved from erbium-based planar waveguides integrated on silicon. Our results show significant advances towards efficient on-chip amplification, opening a route to large-scale integration of various active functionalities on silicon.

Identifiants

pubmed: 30683870
doi: 10.1038/s41467-019-08369-w
pii: 10.1038/s41467-019-08369-w
pmc: PMC6347631
doi:

Types de publication

Journal Article Research Support, Non-U.S. Gov't

Langues

eng

Pagination

432

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Auteurs

John Rönn (J)

Department of Electronics and Nanoengineering, Aalto University, Tietotie 3, FI-00076, Espoo, Finland. john.ronn@aalto.fi.

Weiwei Zhang (W)

Centre for Nanoscience and Nanotechnology (C2N), CNRS, Université Paris-Sud, Université Paris-Saclay, UMR 9001, 91405, Orsay Cedex, France.
Optoelectronics Research Centre, University of Southampton, University Road, Southampton, Hampshire, SO17 1BJ, UK.

Anton Autere (A)

Department of Electronics and Nanoengineering, Aalto University, Tietotie 3, FI-00076, Espoo, Finland.

Xavier Leroux (X)

Centre for Nanoscience and Nanotechnology (C2N), CNRS, Université Paris-Sud, Université Paris-Saclay, UMR 9001, 91405, Orsay Cedex, France.

Lasse Pakarinen (L)

Department of Electronics and Nanoengineering, Aalto University, Tietotie 3, FI-00076, Espoo, Finland.

Carlos Alonso-Ramos (C)

Centre for Nanoscience and Nanotechnology (C2N), CNRS, Université Paris-Sud, Université Paris-Saclay, UMR 9001, 91405, Orsay Cedex, France.

Antti Säynätjoki (A)

Department of Electronics and Nanoengineering, Aalto University, Tietotie 3, FI-00076, Espoo, Finland.
Institute of Photonics, University of Eastern Finland, FI-80101, Joensuu, Finland.

Harri Lipsanen (H)

Department of Electronics and Nanoengineering, Aalto University, Tietotie 3, FI-00076, Espoo, Finland.

Laurent Vivien (L)

Centre for Nanoscience and Nanotechnology (C2N), CNRS, Université Paris-Sud, Université Paris-Saclay, UMR 9001, 91405, Orsay Cedex, France.

Eric Cassan (E)

Centre for Nanoscience and Nanotechnology (C2N), CNRS, Université Paris-Sud, Université Paris-Saclay, UMR 9001, 91405, Orsay Cedex, France. eric.cassan@u-psud.fr.

Zhipei Sun (Z)

Department of Electronics and Nanoengineering, Aalto University, Tietotie 3, FI-00076, Espoo, Finland. zhipei.sun@aalto.fi.
QTF Centre of Excellence, Department of Applied Physics, Aalto University, FI-00076, Espoo, Finland. zhipei.sun@aalto.fi.

Classifications MeSH