Illumination pattern design with deep learning for single-shot Fourier ptychographic microscopy.
Journal
Optics express
ISSN: 1094-4087
Titre abrégé: Opt Express
Pays: United States
ID NLM: 101137103
Informations de publication
Date de publication:
21 Jan 2019
21 Jan 2019
Historique:
entrez:
31
1
2019
pubmed:
31
1
2019
medline:
31
1
2019
Statut:
ppublish
Résumé
Fourier ptychographic microscopy allows for the collection of images with a high space-bandwidth product at the cost of temporal resolution. In Fourier ptychographic microscopy, the light source of a conventional widefield microscope is replaced with a light-emitting diode (LED) matrix, and multiple images are collected with different LED illumination patterns. From these images, a higher-resolution image can be computationally reconstructed without sacrificing field-of-view. We use deep learning to achieve single-shot imaging without sacrificing the space-bandwidth product, reducing the acquisition time in Fourier ptychographic microscopy by a factor of 69. In our deep learning approach, a training dataset of high-resolution images is used to jointly optimize a single LED illumination pattern with the parameters of a reconstruction algorithm. Our work paves the way for high-throughput imaging in biological studies.
Identifiants
pubmed: 30696147
pii: 403687
doi: 10.1364/OE.27.000644
doi:
Types de publication
Journal Article
Langues
eng