Low dose scanning transmission electron microscopy of organic crystals by scanning moiré fringes.
Bright field STEM
Dose-limited resolution
Low dose
Organic crystals
Scanning moiré fringes
Journal
Micron (Oxford, England : 1993)
ISSN: 1878-4291
Titre abrégé: Micron
Pays: England
ID NLM: 9312850
Informations de publication
Date de publication:
05 2019
05 2019
Historique:
received:
30
11
2018
revised:
30
01
2019
accepted:
30
01
2019
pubmed:
12
2
2019
medline:
12
2
2019
entrez:
12
2
2019
Statut:
ppublish
Résumé
In the pharmaceutical industry, it is important to determine the effects of crystallisation and processes, such as milling, on the generation of crystalline defects in formulated products. Conventional transmission electron microscopy and scanning transmission electron microscopy (STEM) can be used to obtain information on length scales unobtainable by other techniques, however, organic crystals are extremely susceptible to electron beam damage. This work demonstrates a bright field (BF) STEM method that can increase the information content per unit specimen damage by the use of scanning moiré fringes (SMFs). SMF imaging essentially provides a magnification of the crystal lattice through the interference between closely aligned lattice fringes and a scanning lattice of similar spacing. The generation of SMFs is shown for three different organic crystals with varying electron beam sensitivity, theophylline, furosemide and felodipine. The electron fluence used to acquire the BF-STEM for the most sensitive material, felodipine was approximately 3.5 e
Identifiants
pubmed: 30739878
pii: S0968-4328(18)30457-8
doi: 10.1016/j.micron.2019.01.014
pii:
doi:
Types de publication
Journal Article
Research Support, Non-U.S. Gov't
Langues
eng
Pagination
1-9Informations de copyright
Copyright © 2019. Published by Elsevier Ltd.