Zone plates for angle-resolved photoelectron spectroscopy providing sub-micrometre resolution in the extreme ultraviolet regime.

Fresnel zone plates angle-resolved photoelectron spectroscopy (ARPES) microspectroscopy nanofocus

Journal

Journal of synchrotron radiation
ISSN: 1600-5775
Titre abrégé: J Synchrotron Radiat
Pays: United States
ID NLM: 9888878

Informations de publication

Date de publication:
01 Mar 2019
Historique:
received: 28 08 2018
accepted: 17 01 2019
entrez: 12 3 2019
pubmed: 12 3 2019
medline: 12 3 2019
Statut: ppublish

Résumé

This article reports on the fabrication and testing of dedicated Fresnel zone plates for use at the nano-ARPES branch of the I05-ARPES beamline of Diamond Light Source to perform angle-resolved photoelectron spectroscopy with sub-micrometre resolution in real space. The aim of the design was to provide high photon flux combined with sub-micrometre spot sizes. The focusing lenses were tested with respect to efficiency and spatial resolution in the extreme ultraviolet between 50 eV and 90 eV. The experimentally determined diffraction efficiencies of the zone plates are as high as 8.6% at 80 eV, and a real-space resolution of 0.4 µm was demonstrated. Using the zone-plate-based setup, monolayer flakes of the two-dimensional semiconductor WS

Identifiants

pubmed: 30855257
pii: S1600577519000869
doi: 10.1107/S1600577519000869
pmc: PMC6412184
doi:

Types de publication

Journal Article

Langues

eng

Pagination

467-472

Subventions

Organisme : Horizon 2020 Framework Programme, H2020 Research and Innovation Programme
ID : 654360

Informations de copyright

open access.

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Auteurs

Benedikt Rösner (B)

Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.

Pavel Dudin (P)

Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX110DE, UK.

Jeroen Bosgra (J)

Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.

Moritz Hoesch (M)

Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX110DE, UK.

Christian David (C)

Paul Scherrer Institut, 5232 Villigen PSI, Switzerland.

Classifications MeSH