Electron holography on Fraunhofer diffraction.

Fraunhofer diffraction double slit electron holography interferometry phase distribution

Journal

Microscopy (Oxford, England)
ISSN: 2050-5701
Titre abrégé: Microscopy (Oxf)
Pays: England
ID NLM: 101595834

Informations de publication

Date de publication:
01 Jun 2019
Historique:
received: 14 11 2018
revised: 24 01 2019
accepted: 30 01 2019
pubmed: 13 3 2019
medline: 13 3 2019
entrez: 13 3 2019
Statut: ppublish

Résumé

Electron holography in Fraunhofer region was realized by using an asymmetric double slit. A Fraunhofer diffraction wave from a wider slit worked as an objective wave interfered with a plane wave from a narrower slit as a reference wave under the pre-Fraunhofer condition and recorded as a hologram. Here, the pre-Fraunhofer condition means that the following conditions are simultaneously satisfied: single-slit observations are performed under the Fraunhofer condition and the double-slit observations are performed under the Fresnel condition. Amplitude and phase distributions of the Fraunhofer diffraction wave were reconstructed from the hologram by the Fourier transform reconstruction method. The reconstructed amplitude and phase images corresponded to Fraunhofer diffraction patterns; in particular, the phase steps of π at each band pattern in the phase image were confirmed. We hope that the developed Fraunhofer electron holography can be extended to a direct phase detection method in the reciprocal space.

Identifiants

pubmed: 30860589
pii: 5376101
doi: 10.1093/jmicro/dfz007
pmc: PMC6547415
doi:

Types de publication

Journal Article

Langues

eng

Pagination

254-260

Informations de copyright

© The Author(s) 2019. Published by Oxford University Press on behalf of The Japanese Society of Microscopy.

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Auteurs

Ken Harada (K)

CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama, Japan.
Department of Materials Science, Osaka Prefecture University, Sakai, Osaka, Japan.

Kodai Niitsu (K)

Department of Materials Science & Engineering, Kyoto University, Kyoto, Kyoto, Japan.

Keiko Shimada (K)

CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama, Japan.

Tetsuji Kodama (T)

Graduate School of Science and Technology, Meijo University, Nagoya, Aichi, Japan.

Tetsuya Akashi (T)

Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama, Japan.
Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka, Fukuoka, Japan.

Yoshimasa A Ono (YA)

CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama, Japan.

Daisuke Shindo (D)

CEMS, RIKEN (The Institute of Physical and Chemical Research), Hatoyama, Saitama, Japan.
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University, Sendai, Miyagi, Japan.

Hiroyuki Shinada (H)

Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama, Japan.

Shigeo Mori (S)

Department of Materials Science, Osaka Prefecture University, Sakai, Osaka, Japan.

Classifications MeSH