Electron holography on Fraunhofer diffraction.
Fraunhofer diffraction
double slit
electron holography
interferometry
phase distribution
Journal
Microscopy (Oxford, England)
ISSN: 2050-5701
Titre abrégé: Microscopy (Oxf)
Pays: England
ID NLM: 101595834
Informations de publication
Date de publication:
01 Jun 2019
01 Jun 2019
Historique:
received:
14
11
2018
revised:
24
01
2019
accepted:
30
01
2019
pubmed:
13
3
2019
medline:
13
3
2019
entrez:
13
3
2019
Statut:
ppublish
Résumé
Electron holography in Fraunhofer region was realized by using an asymmetric double slit. A Fraunhofer diffraction wave from a wider slit worked as an objective wave interfered with a plane wave from a narrower slit as a reference wave under the pre-Fraunhofer condition and recorded as a hologram. Here, the pre-Fraunhofer condition means that the following conditions are simultaneously satisfied: single-slit observations are performed under the Fraunhofer condition and the double-slit observations are performed under the Fresnel condition. Amplitude and phase distributions of the Fraunhofer diffraction wave were reconstructed from the hologram by the Fourier transform reconstruction method. The reconstructed amplitude and phase images corresponded to Fraunhofer diffraction patterns; in particular, the phase steps of π at each band pattern in the phase image were confirmed. We hope that the developed Fraunhofer electron holography can be extended to a direct phase detection method in the reciprocal space.
Identifiants
pubmed: 30860589
pii: 5376101
doi: 10.1093/jmicro/dfz007
pmc: PMC6547415
doi:
Types de publication
Journal Article
Langues
eng
Pagination
254-260Informations de copyright
© The Author(s) 2019. Published by Oxford University Press on behalf of The Japanese Society of Microscopy.
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