Multicolor localization microscopy and point-spread-function engineering by deep learning.


Journal

Optics express
ISSN: 1094-4087
Titre abrégé: Opt Express
Pays: United States
ID NLM: 101137103

Informations de publication

Date de publication:
04 Mar 2019
Historique:
entrez: 17 3 2019
pubmed: 17 3 2019
medline: 17 3 2019
Statut: ppublish

Résumé

Deep learning has become an extremely effective tool for image classification and image restoration problems. Here, we apply deep learning to microscopy and demonstrate how neural networks can exploit the chromatic dependence of the point-spread function to classify the colors of single emitters imaged on a grayscale camera. While existing localization microscopy methods for spectral classification require additional optical elements in the emission path, e.g., spectral filters, prisms, or phase masks, our neural net correctly identifies static and mobile emitters with high efficiency using a standard, unmodified single-channel configuration. Furthermore, we show how deep learning can be used to design new phase-modulating elements that, when implemented into the imaging path, result in further improved color differentiation between species, including simultaneously differentiating four species in a single image.

Identifiants

pubmed: 30876208
pii: 405868
doi: 10.1364/OE.27.006158
doi:

Types de publication

Journal Article

Langues

eng

Pagination

6158-6183

Auteurs

Classifications MeSH