Magnetic Field Patterning of Nickel Nanowire Film Realized by Printed Precursor Inks.

functional printing magnetic alignment metal organic decomposition printed nickel

Journal

Materials (Basel, Switzerland)
ISSN: 1996-1944
Titre abrégé: Materials (Basel)
Pays: Switzerland
ID NLM: 101555929

Informations de publication

Date de publication:
20 Mar 2019
Historique:
received: 28 02 2019
revised: 12 03 2019
accepted: 13 03 2019
entrez: 23 3 2019
pubmed: 23 3 2019
medline: 23 3 2019
Statut: epublish

Résumé

This paper demonstrates an easily prepared novel material and approach to producing aligned nickel (Ni) nanowires having unique and customizable structures on a variety of substrates for electronic and magnetic applications. This is a new approach to producing printed metallic Ni structures from precursor materials, and it provides a novel technique for nanowire formation during reduction. This homogeneous solution can be printed in ambient conditions, and it forms aligned elemental Ni nanowires over large areas upon heating in the presence of a magnetic field. The use of templates or subsequent purification are not required. This technique is very flexible, and allows the preparation of unique patterns of nanowires which provides opportunities to produce structures with enhanced anisotropic electrical and magnetic properties. An example of this is the unique fabrication of aligned nanowire grids by overlaying layers of nanowires oriented at different angles with respect to each other. The resistivity of printed and cured films was found to be as low as 560 µΩ∙cm. The saturation magnetization was measured to be 30 emu∙g

Identifiants

pubmed: 30897771
pii: ma12060928
doi: 10.3390/ma12060928
pmc: PMC6471525
pii:
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : Empire State Development's Division of Science, Technology and Innovation
ID : C150122

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Auteurs

Chaitanya G Mahajan (CG)

Department of Industrial and Systems Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA. cgm5952@rit.edu.

Ahmed Alfadhel (A)

Microsystems Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA. aha4984@gmail.com.

Mark Irving (M)

Department of Industrial and Systems Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA. meieie@rit.edu.

Bruce E Kahn (BE)

AMPrint Center, Rochester Institute of Technology, Rochester, NY 14623, USA. Bruce.Kahn@rit.edu.

David A Borkholder (DA)

Microsystems Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA. dabeee@rit.edu.

Scott A Williams (SA)

School of Chemistry and Materials Science, Rochester Institute of Technology, Rochester, NY 14623, USA. sawppr@rit.edu.

Denis Cormier (D)

Department of Industrial and Systems Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA. drceie@rit.edu.
AMPrint Center, Rochester Institute of Technology, Rochester, NY 14623, USA. drceie@rit.edu.

Classifications MeSH