Substrate Bias Voltage Tailoring the Interfacial Chemistry of a-SiC
DLC
XPS
adhesion
bias voltage
composition
hydrogenated silicon carbide
interface
oxygen
Journal
ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991
Informations de publication
Date de publication:
15 May 2019
15 May 2019
Historique:
pubmed:
6
4
2019
medline:
6
4
2019
entrez:
6
4
2019
Statut:
ppublish
Résumé
Hydrogenated amorphous carbon thin films (a-C:H) have attracted much attention because of their surprising properties, including ultralow friction coefficients in specific conditions. Adhesion of a-C:H films on ferrous alloys is poor due to chemical and physical aspects, avoiding a widespread application of such a film. One possibility to overcome this drawback is depositing an interlayer-an intermediate thin film-between the carbon-based coating and the substrate to improve chemical interaction and adhesion. Based on this, interlayers play a key role on a-C:H thin-film adhesion through a better chemical network structure at the outermost layer of the a-SiC
Identifiants
pubmed: 30951281
doi: 10.1021/acsami.9b03597
doi:
Types de publication
Journal Article
Langues
eng