Facet-Dependent in Situ Growth of Nanoparticles in Epitaxial Thin Films: The Role of Interfacial Energy.
Journal
Journal of the American Chemical Society
ISSN: 1520-5126
Titre abrégé: J Am Chem Soc
Pays: United States
ID NLM: 7503056
Informations de publication
Date de publication:
08 May 2019
08 May 2019
Historique:
pubmed:
19
4
2019
medline:
19
4
2019
entrez:
19
4
2019
Statut:
ppublish
Résumé
Nucleation of nanoparticles using the exsolution phenomenon is a promising pathway to design durable and active materials for catalysis and renewable energy. Here, we focus on the impact of surface orientation of the host lattice on the nucleation dynamics to resolve questions with regards to "preferential nucleation sites". For this, we carried out a systematic model study on three differently oriented perovskite thin films. Remarkably, in contrast to the previous bulk powder-based study suggesting that the (110)-surface is a preferred plane for exsolution, we identify that other planes such as (001)- and (111)-facets also reveal vigorous exsolution. Moreover, particle size and surface coverage vary significantly depending on the surface orientation. Exsolution of (111)-oriented film produces the largest number of particles, the smallest particle size, the deepest embedment, and the smallest and most uniform interparticle distance among the oriented films. Based on classic nucleation theory, we elucidate that the differences in interfacial energies as a function of substrate orientation play a crucial role in controlling the distinct morphology and nucleation behavior of exsolved nanoparticles. Our finding suggests new design principles for tunable solid-state catalyst or nanoscale metal decoration.
Identifiants
pubmed: 30998333
doi: 10.1021/jacs.9b02283
doi:
Types de publication
Journal Article
Langues
eng