Optimal principal component analysis of STEM XEDS spectrum images.

Denoising EDS EDX PCA Reconstruction STEM Spectrum image XEDS

Journal

Advanced structural and chemical imaging
ISSN: 2198-0926
Titre abrégé: Adv Struct Chem Imaging
Pays: Germany
ID NLM: 101687126

Informations de publication

Date de publication:
2019
Historique:
received: 13 12 2018
accepted: 29 03 2019
entrez: 30 4 2019
pubmed: 30 4 2019
medline: 30 4 2019
Statut: ppublish

Résumé

STEM XEDS spectrum images can be drastically denoised by application of the principal component analysis (PCA). This paper looks inside the PCA workflow step by step on an example of a complex semiconductor structure consisting of a number of different phases. Typical problems distorting the principal components decomposition are highlighted and solutions for the successful PCA are described. Particular attention is paid to the optimal truncation of principal components in the course of reconstructing denoised data. A novel accurate and robust method, which overperforms the existing truncation methods is suggested for the first time and described in details.

Identifiants

pubmed: 31032174
doi: 10.1186/s40679-019-0066-0
pii: 66
pmc: PMC6456488
doi:

Types de publication

Journal Article

Langues

eng

Pagination

4

Déclaration de conflit d'intérêts

The authors declare that they have no competing interests.

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Auteurs

Pavel Potapov (P)

1Department of Physics, Technical University of Dresden, Dresden, Germany.
2Leibniz Institute for Solid State and Materials Research (IFW), Dresden, Germany.

Axel Lubk (A)

2Leibniz Institute for Solid State and Materials Research (IFW), Dresden, Germany.

Classifications MeSH