Soft X-ray nanoscale imaging using a sub-pixel resolution charge coupled device (CCD) camera.


Journal

The Review of scientific instruments
ISSN: 1089-7623
Titre abrégé: Rev Sci Instrum
Pays: United States
ID NLM: 0405571

Informations de publication

Date de publication:
Apr 2019
Historique:
entrez: 3 5 2019
pubmed: 3 5 2019
medline: 3 5 2019
Statut: ppublish

Résumé

A sub-pixel 16 bit charge coupled device camera featuring superresolution for the soft X-ray regime is presented. Superresolution images (SRIs) are reconstructed from a set of 4 × 4 individual low-resolution images that are recorded for different sub-pixel shifts of the detector. SRIs have a 1.3 times higher resolution than individual low-resolution images which is close to the maximum achievable enhancement factor of about 1.5 in the X-ray regime under ideal conditions. To characterize this camera and demonstrate its potential, an X-ray microscope setup is used to image different objects at different photon energies.

Identifiants

pubmed: 31042967
doi: 10.1063/1.5053593
doi:

Types de publication

Journal Article

Langues

eng

Pagination

043111

Auteurs

Andrea Lübcke (A)

Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, Max-Born-Strasse 2A, 12489 Berlin, Germany.

Julia Braenzel (J)

Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, Max-Born-Strasse 2A, 12489 Berlin, Germany.

Aurelie Dehlinger (A)

Berlin Laboratory for Innovative X-ray Technologies (BLiX), 10623 Berlin, Germany.

Matthias Schnürer (M)

Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, Max-Born-Strasse 2A, 12489 Berlin, Germany.

Holger Stiel (H)

Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, Max-Born-Strasse 2A, 12489 Berlin, Germany.

Peter Guttmann (P)

Research Group X-Ray Microscopy, Helmholtz-Zentrum Berlin, Albert-Einstein-Str. 15, D-12489 Berlin, Germany.

Stefan Rehbein (S)

Research Group X-Ray Microscopy, Helmholtz-Zentrum Berlin, Albert-Einstein-Str. 15, D-12489 Berlin, Germany.

Gerd Schneider (G)

Research Group X-Ray Microscopy, Helmholtz-Zentrum Berlin, Albert-Einstein-Str. 15, D-12489 Berlin, Germany.

Stephan Werner (S)

Research Group X-Ray Microscopy, Helmholtz-Zentrum Berlin, Albert-Einstein-Str. 15, D-12489 Berlin, Germany.

Roman Kemmler (R)

greateyes GmbH, Justus-von-Liebig-Straße 2, 12489 Berlin, Germany.

Sebastian Ritter (S)

greateyes GmbH, Justus-von-Liebig-Straße 2, 12489 Berlin, Germany.

Marc Raugust (M)

greateyes GmbH, Justus-von-Liebig-Straße 2, 12489 Berlin, Germany.

Torsten Wende (T)

greateyes GmbH, Justus-von-Liebig-Straße 2, 12489 Berlin, Germany.

Marcel Behrendt (M)

greateyes GmbH, Justus-von-Liebig-Straße 2, 12489 Berlin, Germany.

Martin Regehly (M)

greateyes GmbH, Justus-von-Liebig-Straße 2, 12489 Berlin, Germany.

Classifications MeSH