Probing molecular bond-length using molecular-frame photoelectron angular distributions.

Journal

The Journal of chemical physics
ISSN: 1089-7690
Titre abrégé: J Chem Phys
Pays: United States
ID NLM: 0375360

Informations de publication

Date de publication:
07 May 2019
Historique:
entrez: 10 5 2019
pubmed: 10 5 2019
medline: 10 5 2019
Statut: ppublish

Résumé

The molecular-frame photoelectron angular distributions (MFPADs) in O 1s photoemission from CO

Identifiants

DOI: 10.1063/1.5091946 PMID: 31067899
pubmed: 31067899
doi: 10.1063/1.5091946
doi:

Types de publication

Journal Article

Langues

eng

Pagination

174306

Auteurs

Hironobu Fukuzawa (H)

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.
ORCID: 000000028283381X

Robert R Lucchese (RR)

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.
ORCID: 0000000272003775

Xiao-Jing Liu (XJ)

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.

Kentaro Sakai (K)

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.

Hiroshi Iwayama (H)

Department of Physics, Kyoto University, Kyoto 606-8502, Japan.

Kiyonobu Nagaya (K)

Department of Physics, Kyoto University, Kyoto 606-8502, Japan.

Katharina Kreidi (K)

Goeth-Universität Frankfurt am Main, Max-von-Laue-Str. 1, D-60438 Frankfurt, Germany.

Markus S Schöffler (MS)

Goeth-Universität Frankfurt am Main, Max-von-Laue-Str. 1, D-60438 Frankfurt, Germany.

James R Harries (JR)

Japan Synchrotron Radiation Research Institute, Sayo, Hyogo 679-5198, Japan.
ORCID: 0000000321730697

Yusuke Tamenori (Y)

Japan Synchrotron Radiation Research Institute, Sayo, Hyogo 679-5198, Japan.
ORCID: 000000018004895X

Yuichiro Morishita (Y)

National Metrology Institute of Japan, AIST, Tsukuba 305-8568, Japan.

Isao H Suzuki (IH)

National Metrology Institute of Japan, AIST, Tsukuba 305-8568, Japan.
ORCID: 0000000285990351

Norio Saito (N)

National Metrology Institute of Japan, AIST, Tsukuba 305-8568, Japan.
ORCID: 0000000151155676

Kiyoshi Ueda (K)

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.
ORCID: 0000000306080323

Classifications MeSH