Extending the depth-of-field of imaging systems with a scattering diffuser.


Journal

Scientific reports
ISSN: 2045-2322
Titre abrégé: Sci Rep
Pays: England
ID NLM: 101563288

Informations de publication

Date de publication:
09 May 2019
Historique:
received: 20 12 2018
accepted: 26 04 2019
entrez: 11 5 2019
pubmed: 11 5 2019
medline: 11 5 2019
Statut: epublish

Résumé

Large depth of field (DOF) is a longstanding goal in optical imaging field. In this paper we presented a simple but efficient method to extend the DOF of a diffraction-limited imaging system using a thin scattering diffuser. The DOF characteristic of the imaging system with random phase modulation was analyzed based on the analytical model of ambiguity function as a polar display of the optical transfer function (OTF). The results of numerical simulation showed that more high-frequency components existed in the defocused OTF curve when the exit pupil of the imaging system exhibited a random phase modulation. It proved the important role of the scattering diffuser in extending the DOF of imaging systems. For the reconstruction, a stack of point spread functions (PSFs) corresponding to different axial locations within a measurement range were superimposed to construct the stacked PSF. Then the large DOF image was recovered from a speckle pattern by deconvolution. In this proof-of-concept, we experimentally demonstrated the single-shot imaging with larger DOF using a thin glass scattering diffuser in both a single-lens imaging system and a microscopic imaging system.

Identifiants

pubmed: 31073149
doi: 10.1038/s41598-019-43593-w
pii: 10.1038/s41598-019-43593-w
pmc: PMC6509130
doi:

Types de publication

Journal Article

Langues

eng

Pagination

7165

Subventions

Organisme : National Natural Science Foundation of China (National Science Foundation of China)
ID : 61705141
Organisme : National Natural Science Foundation of China (National Science Foundation of China)
ID : 61805152
Organisme : China Postdoctoral Science Foundation
ID : 2017M610544
Organisme : Shenzhen Science and Technology Innovation Commission
ID : JCYJ20170817095047279

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Auteurs

Meihua Liao (M)

College of Optoelectronics Engineering, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen, 518060, China.

Dajiang Lu (D)

College of Optoelectronics Engineering, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen, 518060, China.

Giancarlo Pedrini (G)

Institut fuer Technische Optik, University of Stuttgart, Pfaffenwaldring 9, 70569, Stuttgart, Germany.

Wolfgang Osten (W)

Institut fuer Technische Optik, University of Stuttgart, Pfaffenwaldring 9, 70569, Stuttgart, Germany.

Guohai Situ (G)

Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800, China.

Wenqi He (W)

College of Optoelectronics Engineering, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen, 518060, China.

Xiang Peng (X)

College of Optoelectronics Engineering, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen, 518060, China. xpeng@szu.edu.cn.

Classifications MeSH