Focus characterization of the NanoMAX Kirkpatrick-Baez mirror system.
coherence
holography
nano-focus
Journal
Journal of synchrotron radiation
ISSN: 1600-5775
Titre abrégé: J Synchrotron Radiat
Pays: United States
ID NLM: 9888878
Informations de publication
Date de publication:
01 Jul 2019
01 Jul 2019
Historique:
received:
15
09
2018
accepted:
21
03
2019
entrez:
6
7
2019
pubmed:
6
7
2019
medline:
6
7
2019
Statut:
ppublish
Résumé
The focusing and coherence properties of the NanoMAX Kirkpatrick-Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit. In quasi-coherent operation, beam sizes of down to 56 nm (FWHM, horizontal direction) can be achieved. Comparing measured Airy-like fringe patterns with simulations, the degree of coherence |μ| has been quantified as a function of the secondary source aperture (SSA); the coherence is larger than 50% for SSA sizes below 11 µm at hard X-ray energies of 14 keV. For an SSA size of 5 µm, the degree of coherence has been determined to be 87%.
Identifiants
pubmed: 31274441
pii: S1600577519003886
doi: 10.1107/S1600577519003886
pmc: PMC6613126
doi:
Types de publication
Journal Article
Langues
eng
Pagination
1173-1180Subventions
Organisme : Deutsche Forschungsgemeinschaft
ID : SFB 755
Informations de copyright
open access.
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