Deep neural networks for classifying complex features in diffraction images.


Journal

Physical review. E
ISSN: 2470-0053
Titre abrégé: Phys Rev E
Pays: United States
ID NLM: 101676019

Informations de publication

Date de publication:
Jun 2019
Historique:
received: 18 03 2019
entrez: 24 7 2019
pubmed: 25 7 2019
medline: 25 7 2019
Statut: ppublish

Résumé

Intense short-wavelength pulses from free-electron lasers and high-harmonic-generation sources enable diffractive imaging of individual nanosized objects with a single x-ray laser shot. The enormous data sets with up to several million diffraction patterns present a severe problem for data analysis because of the high dimensionality of imaging data. Feature recognition and selection is a crucial step to reduce the dimensionality. Usually, custom-made algorithms are developed at a considerable effort to approximate the particular features connected to an individual specimen, but because they face different experimental conditions, these approaches do not generalize well. On the other hand, deep neural networks are the principal instrument for today's revolution in automated image recognition, a development that has not been adapted to its full potential for data analysis in science. We recently published [Langbehn et al., Phys. Rev. Lett. 121, 255301 (2018)PRLTAO0031-900710.1103/PhysRevLett.121.255301] the application of a deep neural network as a feature extractor for wide-angle diffraction images of helium nanodroplets. Here we present the setup, our modifications, and the training process of the deep neural network for diffraction image classification and its systematic bench marking. We find that deep neural networks significantly outperform previous attempts for sorting and classifying complex diffraction patterns and are a significant improvement for the much-needed assistance during postprocessing of large amounts of experimental coherent diffraction imaging data.

Identifiants

pubmed: 31330687
doi: 10.1103/PhysRevE.99.063309
doi:

Types de publication

Journal Article

Langues

eng

Pagination

063309

Auteurs

Julian Zimmermann (J)

Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, 12489 Berlin, Germany.

Bruno Langbehn (B)

Institut für Optik und Atomare Physik, Technische Universität Berlin, 10623 Berlin, Germany.

Riccardo Cucini (R)

Elettra-Sincrotrone Trieste S.C.p.A., 34149 Trieste, Italy.

Michele Di Fraia (M)

Elettra-Sincrotrone Trieste S.C.p.A., 34149 Trieste, Italy.
ISM-CNR, Istituto di Struttura della Materia, LD2 Unit, 34149 Trieste, Italy.

Paola Finetti (P)

Elettra-Sincrotrone Trieste S.C.p.A., 34149 Trieste, Italy.

Aaron C LaForge (AC)

Institute of Physics, University of Freiburg, 79104 Freiburg, Germany.

Toshiyuki Nishiyama (T)

Division of Physics and Astronomy, Graduate School of Science, Kyoto University, Kyoto 606-8502, Japan.

Yevheniy Ovcharenko (Y)

Institut für Optik und Atomare Physik, Technische Universität Berlin, 10623 Berlin, Germany.
European XFEL GmbH, 22869 Schenefeld, Germany.

Paolo Piseri (P)

CIMAINA and Dipartimento di Fisica, University degli Studi di Milano, 20133 Milano, Italy.

Oksana Plekan (O)

Elettra-Sincrotrone Trieste S.C.p.A., 34149 Trieste, Italy.

Kevin C Prince (KC)

Elettra-Sincrotrone Trieste S.C.p.A., 34149 Trieste, Italy.
Department of Chemistry and Biotechnology, Swinburne University of Technology, Victoria 3122, Australia.

Frank Stienkemeier (F)

Institute of Physics, University of Freiburg, 79104 Freiburg, Germany.

Kiyoshi Ueda (K)

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.

Carlo Callegari (C)

Elettra-Sincrotrone Trieste S.C.p.A., 34149 Trieste, Italy.
ISM-CNR, Istituto di Struttura della Materia, LD2 Unit, 34149 Trieste, Italy.

Thomas Möller (T)

Institut für Optik und Atomare Physik, Technische Universität Berlin, 10623 Berlin, Germany.

Daniela Rupp (D)

Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, 12489 Berlin, Germany.

Classifications MeSH