Layer Rotation-Angle-Dependent Excitonic Absorption in van der Waals Heterostructures Revealed by Electron Energy Loss Spectroscopy.
electron energy loss spectroscopy
interlayer excitons
scanning transmission electron microscopy
ultrafast charge transfer
van der Waals heterostructure
Journal
ACS nano
ISSN: 1936-086X
Titre abrégé: ACS Nano
Pays: United States
ID NLM: 101313589
Informations de publication
Date de publication:
27 Aug 2019
27 Aug 2019
Historique:
pubmed:
28
7
2019
medline:
28
7
2019
entrez:
27
7
2019
Statut:
ppublish
Résumé
Heterostructures comprising van der Waals (vdW) stacked transition metal dichalcogenide (TMDC) monolayers are a fascinating class of two-dimensional (2D) materials. The presence of interlayer excitons, where the electron and the hole remain spatially separated in the two layers due to ultrafast charge transfer, is an intriguing feature of these heterostructures. The optoelectronic functionality of 2D heterostructure devices is critically dependent on the relative rotation angle of the layers. However, the role of the relative rotation angle of the constituent layers on intralayer absorption is not clear yet. Here, we investigate MoS
Identifiants
pubmed: 31345026
doi: 10.1021/acsnano.9b04530
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM