Label-Free Optical Nanoscopy of Single-Layer Graphene.

absorption saturation nanoscopy pump−probe microscopy single-layer graphene super-resolution

Journal

ACS nano
ISSN: 1936-086X
Titre abrégé: ACS Nano
Pays: United States
ID NLM: 101313589

Informations de publication

Date de publication:
27 08 2019
Historique:
pubmed: 2 8 2019
medline: 26 8 2020
entrez: 2 8 2019
Statut: ppublish

Résumé

The application of ultrafast pulsed laser sources and spectroscopic techniques enables label-free, deep-tissue optical microscopy. However, circumvention of the diffraction limit in this field is still an open challenge. Among such approaches, pump-probe microscopy is of increasing interest thanks to its highly specific nonfluorescent-based contrast mechanisms for the imaging of material and life science samples. In this paper, a custom femtosecond-pulsed near-infrared pump-probe microscope, which exploits transient absorption and stimulated Raman scattering interactions, is presented. The conventional pump-probe configuration is combined with a spatially shaped saturation pump beam, which allows for the reduction of the effective focal volume exploiting transient absorption saturation. By optimizing the acquisition parameters, such as power and temporal overlap of the saturation beam, we can image single-layer graphene deposited on a glass surface at the nanoscale and with increased layer sensitivity. These results suggest that saturation pump-probe nanoscopy is a promising tool for label-free high-resolution imaging.

Identifiants

pubmed: 31369704
doi: 10.1021/acsnano.9b05054
doi:

Substances chimiques

Graphite 7782-42-5

Types de publication

Journal Article Research Support, Non-U.S. Gov't

Langues

eng

Sous-ensembles de citation

IM

Pagination

9673-9681

Auteurs

Giulia Zanini (G)

Nanoscopy and NIC@IIT , Istituto Italiano di Tecnologia , Via Morego 30 , 16163 Genoa , Italy.
Department of Physics , University of Genoa , Via Dodecaneso 33 , 16146 Genoa , Italy.

Kseniya Korobchevskaya (K)

Nanoscopy and NIC@IIT , Istituto Italiano di Tecnologia , Via Morego 30 , 16163 Genoa , Italy.

Takahiro Deguchi (T)

Nanoscopy and NIC@IIT , Istituto Italiano di Tecnologia , Via Morego 30 , 16163 Genoa , Italy.

Alberto Diaspro (A)

Nanoscopy and NIC@IIT , Istituto Italiano di Tecnologia , Via Morego 30 , 16163 Genoa , Italy.
Department of Physics , University of Genoa , Via Dodecaneso 33 , 16146 Genoa , Italy.

Paolo Bianchini (P)

Nanoscopy and NIC@IIT , Istituto Italiano di Tecnologia , Via Morego 30 , 16163 Genoa , Italy.

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Classifications MeSH