Nonlinear ultrasonic phased array with fixed-voltage fundamental wave amplitude difference for high-selectivity imaging of closed cracks.


Journal

The Journal of the Acoustical Society of America
ISSN: 1520-8524
Titre abrégé: J Acoust Soc Am
Pays: United States
ID NLM: 7503051

Informations de publication

Date de publication:
Jul 2019
Historique:
entrez: 3 8 2019
pubmed: 3 8 2019
medline: 3 8 2019
Statut: ppublish

Résumé

The nondestructive evaluation of closed cracks is a challenging subject in ultrasonic testing. Recently, nonlinear ultrasonic phased array with fixed-voltage fundamental wave amplitude difference (fixed-voltage FAD) has been proposed as a practical approach. In this study, the maximum incident wave amplitude, which is one of the most critical parameters in closed-crack imaging, was investigated. First, a theoretical model was formulated to explicitly show the essence of the fundamental principle of FAD and the advantage of fixed-voltage FAD over different-voltage FAD. In experiments, the authors imaged a closed fatigue crack using a nonlinear ultrasonic phased array with fixed-voltage FAD while varying the incident wave amplitude. It was found that when the incident wave amplitude was sufficiently high, the nonlinear image visualized the closed crack tip, which could not be visualized in linear images. In addition, the incident-wave-amplitude dependence of the nonlinear responses was quantified. It was found that different parts within a single fatigue crack showed different nonlinear behaviors. This suggests that fixed-voltage FAD is useful not only for practical application of closed crack imaging but also for examining the nonlinear dynamics at various parts of closed cracks with a high spatial resolution.

Identifiants

pubmed: 31370588
doi: 10.1121/1.5116017
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

266

Auteurs

Yoshikazu Ohara (Y)

Department of Materials Processing, Tohoku University, 6-6-02 Aoba, Aramaki-aza, Aoba-ku, Sendai, Miyagi 980-8579, Japan.

Hiromichi Nakajima (H)

Department of Materials Processing, Tohoku University, 6-6-02 Aoba, Aramaki-aza, Aoba-ku, Sendai, Miyagi 980-8579, Japan.

Sylvain Haupert (S)

Sorbonne Université, CNRS UMR 7371, INSERM UMR S 1146, Laboratoire d'Imagerie Biomédicale, Paris, France.

Toshihiro Tsuji (T)

Department of Materials Processing, Tohoku University, 6-6-02 Aoba, Aramaki-aza, Aoba-ku, Sendai, Miyagi 980-8579, Japan.

Tsuyoshi Mihara (T)

Department of Materials Processing, Tohoku University, 6-6-02 Aoba, Aramaki-aza, Aoba-ku, Sendai, Miyagi 980-8579, Japan.

Classifications MeSH