Electronic Transport Properties of Silicane Determined from First Principles.

DFPT DFT Monte Carlo mobility phonon scattering silicane

Journal

Materials (Basel, Switzerland)
ISSN: 1996-1944
Titre abrégé: Materials (Basel)
Pays: Switzerland
ID NLM: 101555929

Informations de publication

Date de publication:
11 Sep 2019
Historique:
received: 08 08 2019
revised: 02 09 2019
accepted: 06 09 2019
entrez: 14 9 2019
pubmed: 14 9 2019
medline: 14 9 2019
Statut: epublish

Résumé

Silicane, a hydrogenated monolayer of hexagonal silicon, is a candidate material for future complementary metal-oxide-semiconductor technology. We determined the phonon-limited mobility and the velocity-field characteristics for electrons and holes in silicane from first principles, relying on density functional theory. Transport calculations were performed using a full-band Monte Carlo scheme. Scattering rates were determined from interpolated electron-phonon matrix elements determined from density functional perturbation theory. We found that the main source of scattering for electrons and holes was the ZA phonons. Different cut-off wavelengths ranging from 0.58 nm to 16 nm were used to study the possible suppression of the out-of-plane acoustic (ZA) phonons. The low-field mobility of electrons (holes) was obtained as 5 (10) cm

Identifiants

pubmed: 31514338
pii: ma12182935
doi: 10.3390/ma12182935
pmc: PMC6766188
pii:
doi:

Types de publication

Journal Article

Langues

eng

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Auteurs

Mohammad Mahdi Khatami (MM)

Department of Material science and Engineering, The University of Texas at Dallas, Richardson, TX 75080, USA. MohammadMahdi.Khatami2@UTDallas.edu.
Faculty of Electrical and Computer Engineering, Tarbiat Modares University, Tehran 1411713116, Iran. MohammadMahdi.Khatami2@UTDallas.edu.

Gautam Gaddemane (G)

Department of Material science and Engineering, The University of Texas at Dallas, Richardson, TX 75080, USA. gautam.gaddemane@utdallas.edu.

Maarten L Van de Put (ML)

Department of Material science and Engineering, The University of Texas at Dallas, Richardson, TX 75080, USA. maarten.vandeput@utdallas.edu.

Massimo V Fischetti (MV)

Department of Material science and Engineering, The University of Texas at Dallas, Richardson, TX 75080, USA. max.fischetti@utdallas.edu.

Mohammad Kazem Moravvej-Farshi (MK)

Faculty of Electrical and Computer Engineering, Tarbiat Modares University, Tehran 1411713116, Iran. kazem.moravvej@gmail.com.

Mahdi Pourfath (M)

School of Electrical and Computer Engineering, University of Tehran, Tehran 14395-515, Iran. pourfath@ut.ac.ir.

William G Vandenberghe (WG)

Department of Material science and Engineering, The University of Texas at Dallas, Richardson, TX 75080, USA. William.Vandenberghe@utdallas.edu.

Classifications MeSH