Additive-Free Electrophoretic Deposition of Graphene Quantum Dots Thin Films.

electrophoretic deposition graphene quantum dots thin films visible transparency

Journal

Chemistry (Weinheim an der Bergstrasse, Germany)
ISSN: 1521-3765
Titre abrégé: Chemistry
Pays: Germany
ID NLM: 9513783

Informations de publication

Date de publication:
20 Dec 2019
Historique:
revised: 08 09 2019
received: 07 08 2019
pubmed: 27 9 2019
medline: 27 9 2019
entrez: 27 9 2019
Statut: ppublish

Résumé

The electrophoretic deposition (EPD) of graphene-based materials on transparent substrates is highly potential for many applications. Several factors can determine the yield of the EPD process, such as applied voltage, deposition time and particularly the presence of dispersion additives (stabilisers) in the suspension solution. This study presents an additive-free EPD of graphene quantum dot (GQD) thin films on an indium tin oxide (ITO) glass substrate and studies the deposition mechanism with the variation of the applied voltage (10-50 V) and deposition time (5-25 min). It is found that due to the small size (≈3.9 nm) and high content of deprotonated carboxylic groups, the GQDs form a stable dispersion (zeta-potential of about -35 mV) without using additives. The GQD thin films can be deposited onto ITO with optimal surface morphology at 30 V in 5 min (surface roughness of approximately (3.1±1.3) nm). In addition, as-fabricated GQD thin films also possess some interesting physico-optical properties, such as a double-peak photoluminescence at about λ=417 and 439 nm, with approximately 98 % visible transmittance. This low-cost and eco-friendly GQD thin film is a promising material for various applications, for example, transparent conductors, supercapacitors and heat conductive films in smart windows.

Identifiants

pubmed: 31556175
doi: 10.1002/chem.201903596
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

16573-16581

Subventions

Organisme : National Research Foundation Singapore

Informations de copyright

© 2019 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

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Auteurs

Tam D Nguyen (TD)

School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore, 639798, Singapore.
Singapore-HUJ Alliance for Research and Enterprise, NEW-CREATE Phase II, Campus for Research Excellence and Technological Enterprise (CREATE), Singapore, 138602, Singapore.

Ori Geuli (O)

Institute of Chemistry, The Hebrew University of Jerusalem, Jerusalem, 9190401, Israel.

Loo Pin Yeo (LP)

School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore, 639798, Singapore.
Singapore-HUJ Alliance for Research and Enterprise, NEW-CREATE Phase II, Campus for Research Excellence and Technological Enterprise (CREATE), Singapore, 138602, Singapore.

Shlomo Magdassi (S)

Singapore-HUJ Alliance for Research and Enterprise, NEW-CREATE Phase II, Campus for Research Excellence and Technological Enterprise (CREATE), Singapore, 138602, Singapore.
Institute of Chemistry, The Hebrew University of Jerusalem, Jerusalem, 9190401, Israel.

Daniel Mandler (D)

Singapore-HUJ Alliance for Research and Enterprise, NEW-CREATE Phase II, Campus for Research Excellence and Technological Enterprise (CREATE), Singapore, 138602, Singapore.
Institute of Chemistry, The Hebrew University of Jerusalem, Jerusalem, 9190401, Israel.

Alfred Iing Yoong Tok (AIY)

School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore, 639798, Singapore.
Singapore-HUJ Alliance for Research and Enterprise, NEW-CREATE Phase II, Campus for Research Excellence and Technological Enterprise (CREATE), Singapore, 138602, Singapore.

Classifications MeSH