SIFT-ing archaeological artifacts: Selected ion flow tube-mass spectrometry as a new tool in archaeometry.

Archaeology Non-invasive analysis Portable mass spectrometry SIFT-MS

Journal

Talanta
ISSN: 1873-3573
Titre abrégé: Talanta
Pays: Netherlands
ID NLM: 2984816R

Informations de publication

Date de publication:
15 Jan 2020
Historique:
received: 30 05 2019
revised: 02 09 2019
accepted: 04 09 2019
entrez: 10 10 2019
pubmed: 9 10 2019
medline: 9 10 2019
Statut: ppublish

Résumé

A fast non-destructive approach based on the use of portable selected ion flow tube-mass spectrometry (SIFT-MS) was used for the first time to characterize organic materials in archaeological artifacts. The high sensitivity, specificity and selectivity SIFT soft chemical ionization mass spectrometry enabled us to investigate the composition of organic residues collected from ancient Egyptian findings in order to demonstrate the robustness of the techniques with different matrices. In addition, we tested SIFT-MS directly on an archaeological Egyptian amphora to prove its suitability as a completely non-invasive technique. Parallel investigations on all the samples were performed by GC/MS analysis to correlate and confirm the data obtained by SIFT-MS. The possibility of using a portable mass spectrometer on an excavation site or in a museum would be a significant step forward in the non-invasive analysis of organic archaeological materials, enabling archeologists and conservators to obtain real-time information on the molecular composition of organic residues.

Identifiants

pubmed: 31594618
pii: S0039-9140(19)30956-7
doi: 10.1016/j.talanta.2019.120323
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

120323

Informations de copyright

Copyright © 2019 Elsevier B.V. All rights reserved.

Auteurs

Jacopo La Nasa (J)

Department of Chemistry and Industrial Chemistry, University of Pisa, Italy. Electronic address: Jacopo.lanasa@for.unipi.it.

Federica Nardella (F)

Department of Chemistry and Industrial Chemistry, University of Pisa, Italy.

Francesca Modugno (F)

Department of Chemistry and Industrial Chemistry, University of Pisa, Italy.

Maria Perla Colombini (MP)

Department of Chemistry and Industrial Chemistry, University of Pisa, Italy.

Erika Ribechini (E)

Department of Chemistry and Industrial Chemistry, University of Pisa, Italy.

Ilaria Degano (I)

Department of Chemistry and Industrial Chemistry, University of Pisa, Italy.

Classifications MeSH