Interfacial Characterization of Dentin Conditioned with Chitosan Hydroxyapatite Precursor Nanocomplexes Using Time-of-flight Secondary Ion Mass Spectrometry.

The purpose of this study was to evaluate the effect of chitosan-hydroxyapatite precursor (C-HA) nanocomplex conditioning on the chemical modifications at the tricalcium silicate sealer-dentin interface using time-of-flight secondary ion mass spectrometry. Dentin slabs from human premolar root dentin were prepared, demineralized, and randomly distributed between control and C-HA nanocomplex conditioned groups. Tricalcium silicate sealer was applied, and the slabs were allowed to set in 100% humidity for 10 days. The cross-sectional area was exposed, and the sealer-dentin interface was characterized for chemical/ultrastructural evaluation with time-of-flight secondary ion mass spectrometry and transmission electron microscopy, respectively. Chemical analysis revealed the presence of an ion-rich layer constituted of abundant phosphates (PO C-HA nanocomplex conditioning of dentin before tricalcium silicate sealer application resulted in a chemically modified dentin substrate with an ion-rich layer consisting of phosphate, calcium, calcium phosphates, and chitosan that chemically modified the dentin surface/subsurface.

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