Effect of Teflon Transmittance on Sensitivity of Thermoluminescence Dosimeter Cards.


Journal

Health physics
ISSN: 1538-5159
Titre abrégé: Health Phys
Pays: United States
ID NLM: 2985093R

Informations de publication

Date de publication:
06 2020
Historique:
pubmed: 29 10 2019
medline: 7 4 2021
entrez: 29 10 2019
Statut: ppublish

Résumé

Thermoluminescence dosimeter cards purchased by the US Navy in recent years have different radiation sensitivities, e.g., they exhibit a different amount of light per dose unit. Presented tests indicate that the optical transparency of the Teflon encapsulation is partially responsible for the significant variation of the DT-702/PD radiation sensitivity. It was confirmed also that the Teflon transparency is in fact a primary cause of the radiation sensitivity increase in the most recently produced dosimetric cards. This conclusion is based on the correlation found between the calibrated radiation sensitivity of the dosimeter card element and the optical transparency of its Teflon encapsulation. The transparency measurements were performed at the wavelength of 400 nm within a 10 nm spectral interval effectively covering the spectral range of the thermoluminescence. It is anticipated that the experimentally determined correlation will help to approve the acceptance of new thermoluminescence dosimeter cards in the Naval Dosimetry Center inventory as well as improve the production process.

Identifiants

pubmed: 31658164
doi: 10.1097/HP.0000000000001149
pii: 00004032-202006000-00006
pmc: PMC8496950
mid: NIHMS1629779
doi:

Substances chimiques

Polytetrafluoroethylene 9002-84-0

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

623-628

Subventions

Organisme : Intramural NIST DOC
ID : 9999-NIST
Pays : United States

Références

Radiat Prot Dosimetry. 2002;101(1-4):27-42
pubmed: 12382701
Radiat Prot Dosimetry. 2006;120(1-4):273-7
pubmed: 16757494
Phys Chem Chem Phys. 2012 Mar 21;14(11):3968-73
pubmed: 22323107
Health Phys. 2012 May;102(5):535-41
pubmed: 22469931

Auteurs

V B Podobedov (VB)

National Institute of Standards and Technology, Gaithersburg, MD.

A Romanyukha (A)

Naval Dosimetry Center, Bethesda, MD.

C C Miller (CC)

National Institute of Standards and Technology, Gaithersburg, MD.

A Hoy (A)

Naval Dosimetry Center, Bethesda, MD.

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Classifications MeSH