Detecting Sub-GeV Dark Matter with Superconducting Nanowires.


Journal

Physical review letters
ISSN: 1079-7114
Titre abrégé: Phys Rev Lett
Pays: United States
ID NLM: 0401141

Informations de publication

Date de publication:
11 Oct 2019
Historique:
revised: 03 07 2019
received: 12 04 2019
entrez: 9 11 2019
pubmed: 9 11 2019
medline: 9 11 2019
Statut: ppublish

Résumé

We propose the use of superconducting nanowires as both target and sensor for direct detection of sub-GeV dark matter. With excellent sensitivity to small energy deposits on electrons and demonstrated low dark counts, such devices could be used to probe electron recoils from dark matter scattering and absorption processes. We demonstrate the feasibility of this idea using measurements of an existing fabricated tungsten-silicide nanowire prototype with 0.8-eV energy threshold and 4.3 ng with 10 000 s of exposure, which showed no dark counts. The results from this device already place meaningful bounds on dark matter-electron interactions, including the strongest terrestrial bounds on sub-eV dark photon absorption to date. Future expected fabrication on larger scales and with lower thresholds should enable probing of new territory in the direct detection landscape, establishing the complementarity of this approach to other existing proposals.

Identifiants

pubmed: 31702301
doi: 10.1103/PhysRevLett.123.151802
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

151802

Auteurs

Yonit Hochberg (Y)

Racah Institute of Physics, Hebrew University of Jerusalem, Jerusalem 91904, Israel.

Ilya Charaev (I)

Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.

Sae-Woo Nam (SW)

National Institute of Standards and Technology, Boulder, Colorado 80309, USA.

Varun Verma (V)

National Institute of Standards and Technology, Boulder, Colorado 80309, USA.

Marco Colangelo (M)

Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.

Karl K Berggren (KK)

Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.

Classifications MeSH