Determination of X-ray pulse duration via intensity correlation measurements of X-ray fluorescence.
X-ray fluorescence
X-ray free-electron lasers
intensity correlation
Journal
Journal of synchrotron radiation
ISSN: 1600-5775
Titre abrégé: J Synchrotron Radiat
Pays: United States
ID NLM: 9888878
Informations de publication
Date de publication:
01 Nov 2019
01 Nov 2019
Historique:
received:
12
06
2019
accepted:
11
08
2019
entrez:
14
11
2019
pubmed:
14
11
2019
medline:
14
11
2019
Statut:
ppublish
Résumé
A simple method using X-ray fluorescence is proposed to diagnose the duration of an X-ray free-electron laser (XFEL) pulse. This work shows that the degree of intensity correlation of the X-ray fluorescence generated by irradiating an XFEL pulse on metal foil reflects the magnitude relation between the XFEL duration and the coherence time of the fluorescence. Through intensity correlation measurements of copper Kα fluorescence, the duration of 12 keV XFEL pulses from SACLA was evaluated to be ∼10 fs.
Identifiants
pubmed: 31721750
pii: S1600577519011202
doi: 10.1107/S1600577519011202
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
2050-2054Subventions
Organisme : Japan Society for the Promotion of Science
ID : 17K14137
Organisme : Japan Society for the Promotion of Science
ID : 19K20604
Organisme : Japan Synchrotron Radiation Research Institute
ID : 2018B8023
Commentaires et corrections
Type : ErratumIn