Determination of X-ray pulse duration via intensity correlation measurements of X-ray fluorescence.

X-ray fluorescence X-ray free-electron lasers intensity correlation

Journal

Journal of synchrotron radiation
ISSN: 1600-5775
Titre abrégé: J Synchrotron Radiat
Pays: United States
ID NLM: 9888878

Informations de publication

Date de publication:
01 Nov 2019
Historique:
received: 12 06 2019
accepted: 11 08 2019
entrez: 14 11 2019
pubmed: 14 11 2019
medline: 14 11 2019
Statut: ppublish

Résumé

A simple method using X-ray fluorescence is proposed to diagnose the duration of an X-ray free-electron laser (XFEL) pulse. This work shows that the degree of intensity correlation of the X-ray fluorescence generated by irradiating an XFEL pulse on metal foil reflects the magnitude relation between the XFEL duration and the coherence time of the fluorescence. Through intensity correlation measurements of copper Kα fluorescence, the duration of 12 keV XFEL pulses from SACLA was evaluated to be ∼10 fs.

Identifiants

pubmed: 31721750
pii: S1600577519011202
doi: 10.1107/S1600577519011202
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

2050-2054

Subventions

Organisme : Japan Society for the Promotion of Science
ID : 17K14137
Organisme : Japan Society for the Promotion of Science
ID : 19K20604
Organisme : Japan Synchrotron Radiation Research Institute
ID : 2018B8023

Commentaires et corrections

Type : ErratumIn

Auteurs

Ichiro Inoue (I)

RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

Kenji Tamasaku (K)

RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

Taito Osaka (T)

RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

Yuichi Inubushi (Y)

RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

Makina Yabashi (M)

RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

Classifications MeSH