Transmission measurement at the Bernina branch of the Aramis Beamline of SwissFEL.

XFEL instrumentation performance

Journal

Journal of synchrotron radiation
ISSN: 1600-5775
Titre abrégé: J Synchrotron Radiat
Pays: United States
ID NLM: 9888878

Informations de publication

Date de publication:
01 Nov 2019
Historique:
received: 03 07 2019
accepted: 26 09 2019
entrez: 14 11 2019
pubmed: 14 11 2019
medline: 14 11 2019
Statut: ppublish

Résumé

The transmission of the optical components of the Bernina branch of the Aramis beamline at SwissFEL has been measured with an X-ray gas monitor from DESY and compared with a PSI gas detector upstream of the optical components. The transmission efficiencies of the Mo, Si and SiC mirror coatings of the Aramis beamline and the various other in-beam components were evaluated and compared with theoretical calculations, showing an agreement of 6% or better in all cases. The experiment has also shown the efficacy of the high-harmonic rejection mirrors at the Bernina branch of the Aramis beamline at SwissFEL, and characterized the transmission efficiency of the on-line spectrometer in the Aramis beamline. The theoretical transmission of the mirror coatings match the experimental data to within 7%. The accuracy of these measurements was checked against a radiative bolometer from a Japanese collaboration and found to agree to a level of 4% or better. Further comparisons with a diamond detector from a US-based inter-institute collaboration demonstrated a good agreement for the attenuator settings of the beamline.

Identifiants

pubmed: 31721754
pii: S1600577519013237
doi: 10.1107/S1600577519013237
pmc: PMC6853380
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

2081-2085

Informations de copyright

open access.

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Auteurs

Pavle Juranic (P)

Paul Scherrer Institut, Villigen 5232, Switzerland.

Kai Tiedtke (K)

DESY, Notkestrasse 85, 22607 Hamburg, Germany.

Shigeki Owada (S)

Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.

Takahiro Tanaka (T)

National Institute of Advanced Industrial Science and Technology (AIST), NMIJ, Tsukuba 305-8568, Japan.

Ulf Jastrow (U)

DESY, Notkestrasse 85, 22607 Hamburg, Germany.

Andrey Sorokin (A)

DESY, Notkestrasse 85, 22607 Hamburg, Germany.

Luc Patthey (L)

Paul Scherrer Institut, Villigen 5232, Switzerland.

Roman Mankowsky (R)

Paul Scherrer Institut, Villigen 5232, Switzerland.

Markus Degenhardt (M)

DESY, Notkestrasse 85, 22607 Hamburg, Germany.

Yunieski Arbelo (Y)

Paul Scherrer Institut, Villigen 5232, Switzerland.

Christopher Arrell (C)

Paul Scherrer Institut, Villigen 5232, Switzerland.

John Smedley (J)

Los Alamos National Laboratory, Los Alamos, NM 87545, USA.

Jen Bohon (J)

Los Alamos National Laboratory, Los Alamos, NM 87545, USA.

Rolf Follath (R)

Paul Scherrer Institut, Villigen 5232, Switzerland.

Classifications MeSH