Electron spectroscopic study of nanoplasma formation triggered by intense soft x-ray pulses.


Journal

The Journal of chemical physics
ISSN: 1089-7690
Titre abrégé: J Chem Phys
Pays: United States
ID NLM: 0375360

Informations de publication

Date de publication:
14 Nov 2019
Historique:
entrez: 17 11 2019
pubmed: 17 11 2019
medline: 17 11 2019
Statut: ppublish

Résumé

Using electron spectroscopy, we investigated the nanoplasma formation process generated in xenon clusters by intense soft x-ray free electron laser (FEL) pulses. We found clear FEL intensity dependence of electron spectra. Multistep ionization and subsequent ionization frustration features are evident for the low FEL-intensity region, and the thermal electron emission emerges at the high FEL intensity. The present FEL intensity dependence of the electron spectra is well addressed by the frustration parameter introduced by Arbeiter and Fennel [New J. Phys. 13, 053022 (2011)].

Identifiants

pubmed: 31731862
doi: 10.1063/1.5115053
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

184305

Auteurs

Akinobu Niozu (A)

Department of Physics, Kyoto University, Kyoto 606-8502, Japan.

Naomichi Yokono (N)

Department of Physics, Kyoto University, Kyoto 606-8502, Japan.

Toshiyuki Nishiyama (T)

Department of Physics, Kyoto University, Kyoto 606-8502, Japan.

Hironobu Fukuzawa (H)

RIKEN SPring-8 Center, Sayo, Hyogo 679-5148, Japan.

Tomohiro Sakurazawa (T)

Department of Physics, Kyoto University, Kyoto 606-8502, Japan.

Kazuhiro Matsuda (K)

Department of Physics, Kyoto University, Kyoto 606-8502, Japan.

Tsukasa Takanashi (T)

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.

Daehyun You (D)

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.

Yiwen Li (Y)

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.

Taishi Ono (T)

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.

Thomas Gaumnitz (T)

Laboratorium für Physikalische Chemie, ETH Zürich, 8093 Zürich, Switzerland.

Markus Schöffler (M)

Institut für Kernphysik, Goethe-Universität, Max-von-Laue-Strasse 1, 60438 Frankfurt, Germany.

Sven Grundmann (S)

Institut für Kernphysik, Goethe-Universität, Max-von-Laue-Strasse 1, 60438 Frankfurt, Germany.

Shin-Ichi Wada (SI)

Department of Physical Science, Hiroshima University, Higashi-Hiroshima 739-8526, Japan.

Paolo Carpeggiani (P)

Technische Universität Wien, Institut für Photonik, Gußhausstraße 27-29, A-1040 Wien, Austria.

Wei Qing Xu (WQ)

School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, People's Republic of China.

Xiao Jing Liu (XJ)

School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, People's Republic of China.

Shigeki Owada (S)

RIKEN SPring-8 Center, Sayo, Hyogo 679-5148, Japan.

Kensuke Tono (K)

RIKEN SPring-8 Center, Sayo, Hyogo 679-5148, Japan.

Tadashi Togashi (T)

RIKEN SPring-8 Center, Sayo, Hyogo 679-5148, Japan.

Makina Yabashi (M)

RIKEN SPring-8 Center, Sayo, Hyogo 679-5148, Japan.

Nikolai V Kryzhevoi (NV)

Theoretical Chemistry, Institute of Physical Chemistry, Heidelberg University, 69120 Heidelberg, Germany.

Kirill Gokhberg (K)

Theoretical Chemistry, Institute of Physical Chemistry, Heidelberg University, 69120 Heidelberg, Germany.

Alexander I Kuleff (AI)

Theoretical Chemistry, Institute of Physical Chemistry, Heidelberg University, 69120 Heidelberg, Germany.

Lorenz S Cederbaum (LS)

Theoretical Chemistry, Institute of Physical Chemistry, Heidelberg University, 69120 Heidelberg, Germany.

Kiyoshi Ueda (K)

RIKEN SPring-8 Center, Sayo, Hyogo 679-5148, Japan.

Kiyonobu Nagaya (K)

Department of Physics, Kyoto University, Kyoto 606-8502, Japan.

Classifications MeSH