Electron spectroscopic study of nanoplasma formation triggered by intense soft x-ray pulses.
Journal
The Journal of chemical physics
ISSN: 1089-7690
Titre abrégé: J Chem Phys
Pays: United States
ID NLM: 0375360
Informations de publication
Date de publication:
14 Nov 2019
14 Nov 2019
Historique:
entrez:
17
11
2019
pubmed:
17
11
2019
medline:
17
11
2019
Statut:
ppublish
Résumé
Using electron spectroscopy, we investigated the nanoplasma formation process generated in xenon clusters by intense soft x-ray free electron laser (FEL) pulses. We found clear FEL intensity dependence of electron spectra. Multistep ionization and subsequent ionization frustration features are evident for the low FEL-intensity region, and the thermal electron emission emerges at the high FEL intensity. The present FEL intensity dependence of the electron spectra is well addressed by the frustration parameter introduced by Arbeiter and Fennel [New J. Phys. 13, 053022 (2011)].
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM