Compton profile of few-layer graphene investigated by electron energy-loss spectroscopy.


Journal

Scientific reports
ISSN: 2045-2322
Titre abrégé: Sci Rep
Pays: England
ID NLM: 101563288

Informations de publication

Date de publication:
21 Nov 2019
Historique:
received: 20 08 2019
accepted: 28 10 2019
entrez: 23 11 2019
pubmed: 23 11 2019
medline: 23 11 2019
Statut: epublish

Résumé

In this paper, acquisition of the valence Compton profile of few-layer graphene using electron energy-loss spectroscopy at large scattering angle is reported. The experimental Compton profile is compared with the corresponding theoretical profile, calculated using the full-potential linearized augmented plane wave method based on the local-density approximation. Good agreement exists between the theoretical calculation and experiment. The graphene profile indicates a substantially greater delocalization of the ground state charge density compared to that of graphite.

Identifiants

pubmed: 31754249
doi: 10.1038/s41598-019-53928-2
pii: 10.1038/s41598-019-53928-2
pmc: PMC6872718
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

17313

Subventions

Organisme : National Natural Science Foundation of China (National Science Foundation of China)
ID : 11504386
Organisme : Natural Science Foundation of Shandong Province (Shandong Provincial Natural Science Foundation)
ID : ZR2016FQ05

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Auteurs

Zhenbao Feng (Z)

School of Physics Science and Information Technology, Shandong Key Laboratory of Optical Communication Science and Technology, Liaocheng University, Liaocheng, 252059, China. fengzhenbao@lcu.edu.cn.

Xiaoyan Zhang (X)

School of Physics Science and Information Technology, Shandong Key Laboratory of Optical Communication Science and Technology, Liaocheng University, Liaocheng, 252059, China.

Yoshiharu Sakurai (Y)

Japan Synchrotron Radiation Research Institute, SPring-8, 1-1-1 Kouto, Sayo, Hyogo, 679-5198, Japan.

Zongliang Wang (Z)

School of Physics Science and Information Technology, Shandong Key Laboratory of Optical Communication Science and Technology, Liaocheng University, Liaocheng, 252059, China.

Hefu Li (H)

School of Physics Science and Information Technology, Shandong Key Laboratory of Optical Communication Science and Technology, Liaocheng University, Liaocheng, 252059, China.

Haiquan Hu (H)

School of Physics Science and Information Technology, Shandong Key Laboratory of Optical Communication Science and Technology, Liaocheng University, Liaocheng, 252059, China.

Classifications MeSH