Correlated Insulating States in Twisted Double Bilayer Graphene.


Journal

Physical review letters
ISSN: 1079-7114
Titre abrégé: Phys Rev Lett
Pays: United States
ID NLM: 0401141

Informations de publication

Date de publication:
08 Nov 2019
Historique:
received: 19 07 2019
entrez: 26 11 2019
pubmed: 26 11 2019
medline: 26 11 2019
Statut: ppublish

Résumé

We present a combined experimental and theoretical study of twisted double bilayer graphene with twist angles between 1° and 1.35°. Consistent with moiré band structure calculations, we observe insulators at integer moiré band fillings one and three, but not two. An applied transverse electric field separates the first moiré conduction band from neighboring bands, and favors the appearance of correlated insulators at 1/4, 1/2, and 3/4 band filling. Insulating states at 1/4 and 3/4 band filling emerge only in a parallel magnetic field (B_{||}), whereas the resistivity at half band filling is weakly dependent on B_{||}. Our findings suggest that correlated insulators are favored when a moiré flat band is spectrally isolated, and are consistent with a mean-field picture in which insulating states are established by breaking both spin and valley symmetries at 1/4 and 3/4 band filling and valley polarization alone at 1/2 band filling.

Identifiants

pubmed: 31765206
doi: 10.1103/PhysRevLett.123.197702
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

197702

Auteurs

G William Burg (GW)

Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA.

Jihang Zhu (J)

Department of Physics, The University of Texas at Austin, Austin, Texas 78712, USA.

Takashi Taniguchi (T)

National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan.

Kenji Watanabe (K)

National Institute of Materials Science, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan.

Allan H MacDonald (AH)

Department of Physics, The University of Texas at Austin, Austin, Texas 78712, USA.

Emanuel Tutuc (E)

Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, USA.

Classifications MeSH