Single-pass non-destructive electronic detection of charged particles.


Journal

The Review of scientific instruments
ISSN: 1089-7623
Titre abrégé: Rev Sci Instrum
Pays: United States
ID NLM: 0405571

Informations de publication

Date de publication:
01 Nov 2019
Historique:
entrez: 30 11 2019
pubmed: 30 11 2019
medline: 30 11 2019
Statut: ppublish

Résumé

We have devised an experimental method and apparatus for the simultaneous nondestructive determination of the absolute ion number, ion kinetic energy, and length of bunches of charged particles. We have built and operated a corresponding electronic detector that is based on induced charges and their subsequent low-noise amplification at cryogenic temperatures. We have performed measurements with bunches of low-energy highly charged ions from an electron-beam ion source that show the capability of the methods and their implementation. We discuss requirements for, and applications of, such detectors with a particular view on the obtainable information and their sensitivity.

Identifiants

pubmed: 31779428
doi: 10.1063/1.5110988
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

113301

Auteurs

Markus Kiffer (M)

Friedrich Schiller-Universität Jena, 07743 Jena, Germany.

Stefan Ringleb (S)

Friedrich Schiller-Universität Jena, 07743 Jena, Germany.

Nils Stallkamp (N)

Friedrich Schiller-Universität Jena, 07743 Jena, Germany.

Béla Arndt (B)

Goethe-Univerisität Frankfurt, 60629 Frankfurt, Germany.

Ilya Blinov (I)

Technische Universität Darmstadt, 64289 Darmstadt, Germany.

Sugam Kumar (S)

Inter-University Accelerator Centre, 110067 New Delhi, India.

Stefan Stahl (S)

Stahl Electronics, 67582 Mettenheim, Germany.

Thomas Stöhlker (T)

GSI Helmholtzzentrum für Schwerionenforschung, 64291 Darmstadt, Germany.

Manuel Vogel (M)

GSI Helmholtzzentrum für Schwerionenforschung, 64291 Darmstadt, Germany.

Classifications MeSH