Bottom-Up Masking of Si/Ge Surfaces and Nanowire Heterostructures

bottom-up heterostructure nanowire pattern polymer brush semiconductor

Journal

ACS nano
ISSN: 1936-086X
Titre abrégé: ACS Nano
Pays: United States
ID NLM: 101313589

Informations de publication

Date de publication:
28 Jan 2020
Historique:
pubmed: 20 12 2019
medline: 20 12 2019
entrez: 20 12 2019
Statut: ppublish

Résumé

The fully bottom-up and scalable synthesis of complex micro/nanoscale materials and functional devices requires masking methods to define key features and direct the deposition of various coatings and films. Here, we demonstrate selective coaxial lithography

Identifiants

pubmed: 31854980
doi: 10.1021/acsnano.9b04363
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

282-288

Auteurs

Amar T Mohabir (AT)

School of Chemical & Biomolecular Engineering , Georgia Institute of Technology , Atlanta , Georgia 30332 , United States.

Gozde Tutuncuoglu (G)

School of Chemical & Biomolecular Engineering , Georgia Institute of Technology , Atlanta , Georgia 30332 , United States.

Trent Weiss (T)

School of Chemical & Biomolecular Engineering , Georgia Institute of Technology , Atlanta , Georgia 30332 , United States.

Eric M Vogel (EM)

School of Materials Science & Engineering , Georgia Institute of Technology , Atlanta , Georgia 30332 , United States.

Michael A Filler (MA)

School of Chemical & Biomolecular Engineering , Georgia Institute of Technology , Atlanta , Georgia 30332 , United States.

Classifications MeSH