Influence of buried oxide layers of nanostructured SOI surfaces on matrix-free LDI-MS performances.


Journal

The Analyst
ISSN: 1364-5528
Titre abrégé: Analyst
Pays: England
ID NLM: 0372652

Informations de publication

Date de publication:
17 Feb 2020
Historique:
pubmed: 17 1 2020
medline: 21 11 2020
entrez: 17 1 2020
Statut: ppublish

Résumé

In this paper, we report on the nanostructuration of the silicon crystalline top layer of different "home-made" SOI substrates presenting various buried oxide (BOx) layer thicknesses. The nanostructuration was achieved via a one-step metal assisted chemical etching (MACE) procedure. The etched N-SOI substrate surfaces were then characterized by AFM, SEM and photoluminescence. To investigate their laser desorption/ionization mass spectrometry performances, the different surfaces have been assessed towards peptide mixtures. We have shown that the matrix-free LDI process occurred from surface heating after laser irradiation and was fostered by thermal confinement in the thin nanostructured Si surface layer. This thermal confinement was enhanced with the increase of the buried oxide layer thickness until an optimal thickness of 200 nm for which the best results in terms of signal intensities, peptide discrimination and spot to spot and surface to surface variations were found.

Identifiants

pubmed: 31942880
doi: 10.1039/c9an02181g
doi:

Substances chimiques

Oxides 0
Water 059QF0KO0R

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

1328-1336

Auteurs

Abderrahmane Hamdi (A)

Univ. Lille, CNRS, Centrale Lille, ISEN, Univ. Valenciennes, IEMN, UMR CNRS 8520, Avenue Poincaré, BP 60069, 59652 Villeneuve d'Ascq, France. yannick.coffinier@univ-lille.fr.

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Classifications MeSH