Superior polarization retention through engineered domain wall pinning.


Journal

Nature communications
ISSN: 2041-1723
Titre abrégé: Nat Commun
Pays: England
ID NLM: 101528555

Informations de publication

Date de publication:
17 Jan 2020
Historique:
received: 02 06 2019
accepted: 11 12 2019
entrez: 19 1 2020
pubmed: 19 1 2020
medline: 19 1 2020
Statut: epublish

Résumé

Ferroelectric materials possess a spontaneous polarization that is switchable by an electric field. Robust retention of switched polarization is critical for non-volatile nanoelectronic devices based on ferroelectrics, however, these materials often suffer from polarization relaxation, typically within days to a few weeks. Here we exploit designer-defect-engineered epitaxial BiFeO

Identifiants

pubmed: 31953393
doi: 10.1038/s41467-019-14250-7
pii: 10.1038/s41467-019-14250-7
pmc: PMC6969134
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

349

Références

Garcia, V. et al. Giant tunnel electroresistance for non-destructive readout of ferroelectric states. Nature 460, 81–84 (2009).
pubmed: 19483675 doi: 10.1038/nature08128 pmcid: 19483675
Chanthbouala, A. et al. Solid-state memories based on ferroelectric tunnel junctions. Nat. Nanotechnol. 7, 101–104 (2012).
doi: 10.1038/nnano.2011.213
Manipatruni, S. et al. Scalable energy-efficient magnetoelectric spin-orbit logic. Nature 565, 35–42 (2019).
pubmed: 30510160 doi: 10.1038/s41586-018-0770-2 pmcid: 30510160
Scott, J. F. & Paz de Araujo, C. A. Ferroelectric memories. Science 246, 1400–1405 (1989).
pubmed: 17755995 doi: 10.1126/science.246.4936.1400 pmcid: 17755995
Scott, J. F. Ferroelectric memories (Springer Science & Business Media, 2013).
Setter, N. et al. Ferroelectric thin films: review of materials, properties, and applications. J. Appl. Phys. 100, 051606 (2006).
doi: 10.1063/1.2336999
Scott, J. F. Applications of modern ferroelectrics. Science 315, 954–959 (2007).
pubmed: 17303745 doi: 10.1126/science.1129564 pmcid: 17303745
Arimoto, Y. & Ishiwara, H. Current status of ferroelectric random-access memory. MRS Bull. 29, 823–828 (2004).
doi: 10.1557/mrs2004.235
Paruch, P., Tybell, T. & Triscone, J.-M. Nanoscale control of ferroelectric polarization and domain size in epitaxial Pb (Zr
doi: 10.1063/1.1388024
Kalinin, S. V., Gruverman, A. Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale (Springer Science & Business Media, 2007).
Hong, S., Auciello, O., Wouters, D. Emerging Non-Volatile Memories (Springer, 2014).
Gruverman, A. & Kholkin, A. Nanoscale ferroelectrics: processing, characterization and future trends. Rep. Prog. Phys. 69, 2443 (2005).
doi: 10.1088/0034-4885/69/8/R04
Tanaka, K. et al. Scanning nonlinear dielectric microscopy nano-science and technology for next generation high density ferroelectric data storage. Jpn. J. Appl. Phys. 47, 3311–3325 (2008).
doi: 10.1143/JJAP.47.3311
Cho, Y. S. et al. Tbit/inch
doi: 10.1063/1.1526916
Cho, Y. S., Hashimoto, S., Odagawa, N., Tanaka, K., Hiranaga, Y. Realization of 10 Tbit/in.
doi: 10.1063/1.2140894
Gruverman, A. & Tanaka, M. Polarization retention in SrBi
doi: 10.1063/1.1334938
Ganpule, C. et al. Polarization relaxation kinetics and 180 domain wall dynamics in ferroelectric thin films. Phys. Rev. B 65, 014101 (2001).
doi: 10.1103/PhysRevB.65.014101
Ganpule, C. S. et al. Domain nucleation and relaxation kinetics in ferroelectric thin films. Appl. Phys. Lett. 77, 3275–3277 (2000).
doi: 10.1063/1.1322051
Zhang, Z. G. et al. Retention characteristics of SrBi
doi: 10.1063/1.122859
Balke, N., Ramesh, R. & Yu, P. Manipulating ferroelectrics through changes in surface and interface properties. ACS Appl. Mater. Interfaces 9, 39736–39746 (2017).
pubmed: 29058429 doi: 10.1021/acsami.7b10747 pmcid: 29058429
Gruverman, A. et al. Nanoscale imaging of domain dynamics and retention in ferroelectric thin films. Appl. Phys. Lett. 71, 3492–3494 (1997).
doi: 10.1063/1.120369
Song, T. K., Yoon, J.-G. & Kwun, S.-I. Microscopic polarization retention properties of ferroelectric Pb(Zr,Ti)O
doi: 10.1080/00150190600689332
Hong, J. et al. Nanoscale investigation of domain retention in preferentially oriented PbZr
doi: 10.1063/1.125271
Fong, D. D. et al. Stabilization of monodomain polarization in ultrathin PbTiO
pubmed: 16605959 doi: 10.1103/PhysRevLett.96.127601 pmcid: 16605959
Kan, Y. et al. Critical radii of ferroelectric domains for different decay processes in LiNbO
doi: 10.1063/1.2790475
Kim, D. J. et al. Polarization relaxation induced by a depolarization field in ultrathin ferroelectric capacitors. Phys. Rev. Lett. 95, 237602 (2005).
pubmed: 16384347 doi: 10.1103/PhysRevLett.95.237602 pmcid: 16384347
Lu, H. et al. Enhancement of ferroelectric polarization stability by interface engineering. Adv. Mater. 24, 1209–1216 (2012).
pubmed: 22278910 doi: 10.1002/adma.201104398 pmcid: 22278910
Chen, Y. C., Ko, C. H., Huang, Y. C., Yang, J. C. & Chu, Y. H. Domain relaxation dynamics in epitaxial BiFeO
doi: 10.1063/1.4746077
Lee, C. C., Wu, J. M. Thickness-dependent retention behaviors and ferroelectric properties of BiFeO
Huang, Y. C. et al. Giant enhancement of ferroelectric retention in BiFeO
pubmed: 25113412 doi: 10.1002/adma.201402442 pmcid: 25113412
Hsieh, Y.-H. et al. Permanent ferroelectric retention of BiFeO
pubmed: 27782123 pmcid: 5095170 doi: 10.1038/ncomms13199
Sando, D., Xu, B., Bellaiche, L. & Nagarajan, V. A multiferroic on the brink: Uncovering the nuances of strain-induced transitions in BiFeO
doi: 10.1063/1.4944558
Zeches, R. J. et al. A strain-driven morphotropic phase boundary in BiFeO
pubmed: 19965507 doi: 10.1126/science.1177046 pmcid: 19965507
Damodaran, A. R. et al. Nanoscale structure and mechanism for enhanced electromechanical response of highly Strained BiFeO
pubmed: 21608053 doi: 10.1002/adma.201101164 pmcid: 21608053
Zhang, J. X. et al. Microscopic origin of the giant ferroelectric polarization in tetragonal-like BiFeO
pubmed: 22107234 doi: 10.1103/PhysRevLett.107.147602 pmcid: 22107234
Zhang, J. X. et al. Large field-induced strains in a lead-free piezoelectric material. Nat. Nanotechnol. 6, 98–102 (2011).
pubmed: 21240285 doi: 10.1038/nnano.2010.265 pmcid: 21240285
Sando, D. et al. Large elasto-optic effect and reversible electrochromism in multiferroic BiFeO
pubmed: 26923332 pmcid: 4773452 doi: 10.1038/ncomms10718
He, Q. et al. Electrically controllable spontaneous magnetism in nanoscale mixed phase multiferroics. Nat. Commun. 2, 225 (2011).
pubmed: 21407191 doi: 10.1038/ncomms1221 pmcid: 21407191
Seidel, J. et al. Electronic properties of isosymmetric phase boundaries in highly strained Ca-Doped BiFeO
pubmed: 24729350 doi: 10.1002/adma.201400557 pmcid: 24729350
Kim, K. E. et al. Electric control of straight stripe conductive mixed-phase nanostructures in La-doped BiFeO
doi: 10.1038/am.2013.72
Seidel, J. et al. Domain wall functionality in BiFeO
doi: 10.1080/01411594.2012.695371
Heo, Y., Jang, B. K., Kim, S. J., Yang, C. H. & Seidel, J. Nanoscale mechanical softening of morphotropic BiFeO
pubmed: 25327302 doi: 10.1002/adma.201401958 pmcid: 25327302
Zhou, J. et al. Directed assembly of nano-scale phase variants in highly strained BiFeO
doi: 10.1063/1.4752395
Young, T. et al. Structural, magnetic, and ferroelectric properties of T-like cobalt-doped BiFeO
doi: 10.1063/1.5011783
Sando, D. et al. Designer defect stabilization of the super tetragonal phase in > 70-nm-thick BiFeO3 films on LaAlO
doi: 10.7567/JJAP.57.0902B2
Sando, D., Barthelemy, A. & Bibes, M. BiFeO
pubmed: 25352066 doi: 10.1088/0953-8984/26/47/473201 pmcid: 25352066
Christen, H. M., Nam, J. H., Kim, H. S., Hatt, A. J. & Spaldin, N. A. Stress-induced R−M
doi: 10.1103/PhysRevB.83.144107
Chen, Z. et al. Low symmetry monoclinic Mc phase in epitaxial BiFeO
doi: 10.1063/1.3525378
Xie, L. et al. Giant ferroelectric polarization in ultrathin ferroelectrics via boundary-condition engineering. Adv. Mater. 29, 1701475 (2017).
doi: 10.1002/adma.201701475
Lubk, A. et al. Electromechanical coupling among edge dislocations, domain walls, and nanodomains in BiFeO
pubmed: 23418908 doi: 10.1021/nl304229k pmcid: 23418908
Lubk, A. et al. Evidence of sharp and diffuse domain walls in BiFeO
pubmed: 23006107 doi: 10.1103/PhysRevLett.109.047601 pmcid: 23006107
Catalan, G., Seidel, J., Ramesh, R. & Scott, J. F. Domain wall nanoelectronics. Rev. Mod. Phys. 84, 119 (2012).
doi: 10.1103/RevModPhys.84.119
Jia, C.-L. et al. Atomic-scale study of electric dipoles near charged and uncharged domain walls in ferroelectric films. Nat. Mater. 7, 57–61 (2008).
pubmed: 18066068 doi: 10.1038/nmat2080 pmcid: 18066068
Rodriguez, B. J. et al. Domain growth kinetics in lithium niobate single crystals studied by piezoresponse force microscopy. Appl. Phys. Lett. 86, 012906 (2005).
doi: 10.1063/1.1845594
Paruch, P., Giamarchi, T., Tybell, T. & Triscone, J. M. Nanoscale studies of domain wall motion in epitaxial ferroelectric thin films. J. Appl. Phys. 100, 051608 (2006).
doi: 10.1063/1.2337356
Pertsev, N. A. et al. Dynamics of ferroelectric nanodomains in BaTiO
pubmed: 21832557 doi: 10.1088/0957-4484/19/37/375703 pmcid: 21832557
Tybell, T., Paruch, P., Giamarchi, T. & Triscone, J. M. Domain wall creep in epitaxial ferroelectric Pb(Zr
pubmed: 12190438 doi: 10.1103/PhysRevLett.89.097601 pmcid: 12190438
Chen, Y. C., Lin, Q. R. & Chu, Y. H. Domain growth dynamics in single-domain-like BiFeO
doi: 10.1063/1.3109779
Kim, W. H., Yoon, S. M. & Son, J. Y. Ferroelectric domain wall motion in epitaxial PbTiO
doi: 10.1016/j.matlet.2014.03.069
Chen, Y. C. et al. Non-volatile domain nucleation and growth in multiferroic BiFeO
pubmed: 21572209 doi: 10.1088/0957-4484/22/25/254030 pmcid: 21572209
Vasudevan, R. K. et al. Nanoscale control of phase variants in strain-engineered BiFeO
pubmed: 21702441 doi: 10.1021/nl201719w pmcid: 21702441
Chen, W. G. et al. Nanoscale polarization relaxation of epitaxial BiFeO
doi: 10.1016/j.tsf.2010.03.089
Fu, D. S., Suzuki, K., Kato, K. & Suzuki, H. Dynamics of nanoscale polarization backswitching in tetragonal lead zirconate titanate thin film. Appl. Phys. Lett. 82, 2130–2132 (2003).
doi: 10.1063/1.1565502
Shvartsman, V., Kholkin, A., Tyunina, M. & Levoska, J. Relaxation of induced polar state in relaxor PbMg
doi: 10.1063/1.1942635
Zeng, H., Shimamura, K., Villora, E. G., Takekawa, S. & Kitamura, K. Domain growth kinetics and wall strain behavior in BaMgF
doi: 10.1063/1.2645955
Neradovskaya, E. A. et al. Polarization reversal by tip of scanning probe microscope in SBN. KnE Mater. Sci. 2016, 115–121 (2016).
doi: 10.18502/kms.v1i1.572
Baek, S. H. et al. Ferroelastic switching for nanoscale non-volatile magnetoelectric devices. Nat. Mater. 9, 309–314 (2010).
pubmed: 20190772 doi: 10.1038/nmat2703 pmcid: 20190772
Catalan, G. et al. Fractal dimension and size scaling of domains in thin films of multiferroic BiFeO3. Phys. Rev. Lett. 100, 027602 (2008).
Sharma, P., Reece, T. J., Ducharme, S. & Gruverman, A. High-resolution studies of domain switching behavior in nanostructured ferroelectric polymers. Nano Lett. 11, 1970–1975 (2011).
pubmed: 21462936 doi: 10.1021/nl200221z pmcid: 21462936
Seidel, J. Domain walls as nanoscale functional elements. J. Phys. Chem. Lett. 3, 2905–2909 (2012).
doi: 10.1021/jz3011223

Auteurs

Dawei Zhang (D)

School of Materials Science and Engineering, UNSW Sydney, Sydney, NSW, 2052, Australia.

Daniel Sando (D)

School of Materials Science and Engineering, UNSW Sydney, Sydney, NSW, 2052, Australia. daniel.sando@unsw.edu.au.
ARC Centre of Excellence in Future Low-Energy Electronics Technologies, UNSW Sydney, Sydney, NSW, 2052, Australia. daniel.sando@unsw.edu.au.
Mark Wainwright Analytical Centre, UNSW Sydney, High Street, Kensington, NSW, 2052, Australia. daniel.sando@unsw.edu.au.

Pankaj Sharma (P)

School of Materials Science and Engineering, UNSW Sydney, Sydney, NSW, 2052, Australia. pankaj.sharma@unsw.edu.au.
ARC Centre of Excellence in Future Low-Energy Electronics Technologies, UNSW Sydney, Sydney, NSW, 2052, Australia. pankaj.sharma@unsw.edu.au.

Xuan Cheng (X)

Department of Materials Science and Engineering, Monash University, Melbourne, VIC, 3800, Australia.

Fan Ji (F)

School of Materials Science and Engineering, UNSW Sydney, Sydney, NSW, 2052, Australia.
ARC Centre of Excellence in Future Low-Energy Electronics Technologies, UNSW Sydney, Sydney, NSW, 2052, Australia.

Vivasha Govinden (V)

School of Materials Science and Engineering, UNSW Sydney, Sydney, NSW, 2052, Australia.
ARC Centre of Excellence in Future Low-Energy Electronics Technologies, UNSW Sydney, Sydney, NSW, 2052, Australia.

Matthew Weyland (M)

Department of Materials Science and Engineering, Monash University, Melbourne, VIC, 3800, Australia.
Monash Centre for Electron Microscopy, Monash University, Melbourne, VIC, 3800, Australia.

Valanoor Nagarajan (V)

School of Materials Science and Engineering, UNSW Sydney, Sydney, NSW, 2052, Australia.
ARC Centre of Excellence in Future Low-Energy Electronics Technologies, UNSW Sydney, Sydney, NSW, 2052, Australia.

Jan Seidel (J)

School of Materials Science and Engineering, UNSW Sydney, Sydney, NSW, 2052, Australia. jan.seidel@unsw.edu.au.
ARC Centre of Excellence in Future Low-Energy Electronics Technologies, UNSW Sydney, Sydney, NSW, 2052, Australia. jan.seidel@unsw.edu.au.

Classifications MeSH