Influence of Annealing Atmosphere on the Characteristics of Ga

gallium oxide heterojunction diodes silicon carbide thermal activation energy

Journal

Materials (Basel, Switzerland)
ISSN: 1996-1944
Titre abrégé: Materials (Basel)
Pays: Switzerland
ID NLM: 101555929

Informations de publication

Date de publication:
16 Jan 2020
Historique:
received: 26 12 2019
revised: 13 01 2020
accepted: 14 01 2020
entrez: 23 1 2020
pubmed: 23 1 2020
medline: 23 1 2020
Statut: epublish

Résumé

Ga

Identifiants

pubmed: 31963320
pii: ma13020434
doi: 10.3390/ma13020434
pmc: PMC7013600
pii:
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : National Research Foundation
ID : 2018R1D1A1B07047515
Organisme : Korea Electric Power Corporation
ID : R17XA05-60

Références

Nanoscale Res Lett. 2019 Jan 7;14(1):8
pubmed: 30617428

Auteurs

Young-Jae Lee (YJ)

Department of Electronic Materials Engineering, Kwangwoon University, 20 Kwangwoon-ro, Nowon-gu, Seoul 01897, Korea.

Michael A Schweitz (MA)

Department of Electronic Materials Engineering, Kwangwoon University, 20 Kwangwoon-ro, Nowon-gu, Seoul 01897, Korea.

Jong-Min Oh (JM)

Department of Electronic Materials Engineering, Kwangwoon University, 20 Kwangwoon-ro, Nowon-gu, Seoul 01897, Korea.

Sang-Mo Koo (SM)

Department of Electronic Materials Engineering, Kwangwoon University, 20 Kwangwoon-ro, Nowon-gu, Seoul 01897, Korea.

Classifications MeSH