Low-Energy Electron Escape from Liquid Interfaces: Charge and Quantum Effects.


Journal

Physical review letters
ISSN: 1079-7114
Titre abrégé: Phys Rev Lett
Pays: United States
ID NLM: 0401141

Informations de publication

Date de publication:
10 Jan 2020
Historique:
received: 23 08 2019
entrez: 25 1 2020
pubmed: 25 1 2020
medline: 25 1 2020
Statut: ppublish

Résumé

The high surface sensitivity and controlled surface charge state of submicron sized droplets is exploited to study low-energy electron transport through liquid interfaces using photoelectron imaging. Already a few charges on a droplet are found to modify the photoelectron images significantly. For narrow escape barriers, the comparison with an electron scattering model reveals pronounced quantum effects in the form of above-barrier reflections at electron kinetic energies below about 1 eV. The observed susceptibility to the characteristics of the electron escape barrier might provide access to these properties for liquid interfaces, which are generally difficult to investigate.

Identifiants

pubmed: 31976689
doi: 10.1103/PhysRevLett.124.013402
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

013402

Auteurs

Loren Ban (L)

Department of Chemistry and Applied Biosciences, Laboratory of Physical Chemistry, ETH Zürich, Vladimir-Prelog Weg 2, CH-8093 Zürich, Switzerland.

Thomas E Gartmann (TE)

Department of Chemistry and Applied Biosciences, Laboratory of Physical Chemistry, ETH Zürich, Vladimir-Prelog Weg 2, CH-8093 Zürich, Switzerland.

Bruce L Yoder (BL)

Department of Chemistry and Applied Biosciences, Laboratory of Physical Chemistry, ETH Zürich, Vladimir-Prelog Weg 2, CH-8093 Zürich, Switzerland.

R Signorell (R)

Department of Chemistry and Applied Biosciences, Laboratory of Physical Chemistry, ETH Zürich, Vladimir-Prelog Weg 2, CH-8093 Zürich, Switzerland.

Classifications MeSH