Nanoscale Mapping of the Double Layer Potential at the Graphene-Electrolyte Interface.

Electrical double layer KPFM SEM electrolyte interface graphene

Journal

Nano letters
ISSN: 1530-6992
Titre abrégé: Nano Lett
Pays: United States
ID NLM: 101088070

Informations de publication

Date de publication:
12 02 2020
Historique:
pubmed: 29 1 2020
medline: 29 1 2020
entrez: 29 1 2020
Statut: ppublish

Résumé

The electrical double layer (EDL) governs the operation of multiple electrochemical devices, determines reaction potentials, and conditions ion transport through cellular membranes in living organisms. The few existing methods of EDL probing have low spatial resolution, usually only providing spatially averaged information. On the other hand, traditional Kelvin probe force microscopy (KPFM) is capable of mapping potential with nanoscale lateral resolution but cannot be used in electrolytes with concentrations higher than several mmol/L. Here, we resolve this experimental impediment by combining KPFM with graphene-capped electrolytic cells to quantitatively measure the potential drop across the EDL in aqueous electrolytes of decimolar and molar concentrations with a high lateral resolution. The surface potential of graphene in contact with deionized water and 0.1 mol/L solutions of CuSO

Identifiants

pubmed: 31990570
doi: 10.1021/acs.nanolett.9b04823
doi:

Types de publication

Journal Article Research Support, Non-U.S. Gov't

Langues

eng

Sous-ensembles de citation

IM

Pagination

1336-1344

Auteurs

Evgheni Strelcov (E)

Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.
Maryland NanoCenter , University of Maryland , College Park , Maryland 20742 , United States.

Christopher Arble (C)

Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.

Hongxuan Guo (H)

SEU-FEI Nano-Pico Center, Key Laboratory of MEMS of Ministry of Education , Southeast University , Nanjing 210096 , China.

Brian D Hoskins (BD)

Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.

Alexander Yulaev (A)

Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.
Department of Chemistry and Biochemistry , University of Maryland , College Park , Maryland 20742 , United States.

Ivan V Vlassiouk (IV)

Oak Ridge National Laboratory , Oak Ridge , Tennessee 37830 , United States.

Nikolai B Zhitenev (NB)

Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.

Alexander Tselev (A)

Department of Physics and CICECO-Aveiro Institute of Materials , University of Aveiro , 3810-193 Aveiro , Portugal.

Andrei Kolmakov (A)

Physical Measurement Laboratory , National Institute of Standards and Technology , Gaithersburg , Maryland 20899 , United States.

Classifications MeSH