Machine learning approaches for ELNES/XANES.

ELNES XANES first principles simulation machine learning

Journal

Microscopy (Oxford, England)
ISSN: 2050-5701
Titre abrégé: Microscopy (Oxf)
Pays: England
ID NLM: 101595834

Informations de publication

Date de publication:
08 Apr 2020
Historique:
received: 10 02 2019
revised: 14 09 2019
accepted: 16 09 2019
pubmed: 30 1 2020
medline: 30 1 2020
entrez: 30 1 2020
Statut: ppublish

Résumé

Materials characterization is indispensable for materials development. In particular, spectroscopy provides atomic configuration, chemical bonding and vibrational information, which are crucial for understanding the mechanism underlying the functions of a material. Despite its importance, the interpretation of spectra using human-driven methods, such as manual comparison of experimental spectra with reference/simulated spectra, is becoming difficult owing to the rapid increase in experimental spectral data. To overcome the limitations of such methods, we develop new data-driven approaches based on machine learning. Specifically, we use hierarchical clustering, a decision tree and a feedforward neural network to investigate the electron energy loss near edge structures (ELNES) spectrum, which is identical to the X-ray absorption near edge structure (XANES) spectrum. Hierarchical clustering and the decision tree are used to interpret and predict ELNES/XANES, while the feedforward neural network is used to obtain hidden information about the material structure and properties from the spectra. Further, we construct a prediction model that is robust against noise by data augmentation. Finally, we apply our method to noisy spectra and predict six properties accurately. In summary, the proposed approaches can pave the way for fast and accurate spectrum interpretation/prediction as well as local measurement of material functions.

Identifiants

pubmed: 31993623
pii: 5714813
doi: 10.1093/jmicro/dfz109
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

92-109

Informations de copyright

© The Author(s) 2020. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Auteurs

Teruyasu Mizoguchi (T)

Institute of Industrial Science, The University of Tokyo, Komaba, Tokyo 113-8505, Japan.

Shin Kiyohara (S)

Institute of Industrial Science, The University of Tokyo, Komaba, Tokyo 113-8505, Japan.

Classifications MeSH