Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions.
Journal
Micromachines
ISSN: 2072-666X
Titre abrégé: Micromachines (Basel)
Pays: Switzerland
ID NLM: 101640903
Informations de publication
Date de publication:
18 Feb 2020
18 Feb 2020
Historique:
received:
17
01
2020
accepted:
19
01
2020
entrez:
23
2
2020
pubmed:
23
2
2020
medline:
23
2
2020
Statut:
epublish
Résumé
In Section 3 [...].
Identifiants
pubmed: 32085657
pii: mi11020211
doi: 10.3390/mi11020211
pmc: PMC7074676
pii:
doi:
Types de publication
Published Erratum
Langues
eng
Commentaires et corrections
Type : ErratumFor
Références
Micromachines (Basel). 2019 Nov 21;10(12):
pubmed: 31766480