Automated acquisition of vast numbers of electron holograms with atomic-scale phase information.

atomic resolution automated acquisition electron holography gold nanoparticle mean inner potential transmission electron microscope

Journal

Microscopy (Oxford, England)
ISSN: 2050-5701
Titre abrégé: Microscopy (Oxf)
Pays: England
ID NLM: 101595834

Informations de publication

Date de publication:
08 Apr 2020
Historique:
received: 07 08 2019
revised: 23 01 2020
accepted: 04 02 2020
pubmed: 3 3 2020
medline: 3 3 2020
entrez: 3 3 2020
Statut: ppublish

Résumé

An automated acquisition system for collecting a large number of electron holograms, to improve the statistical precision of phase analysis, was developed. A technique for shifting the electron beam in combination with stage movement allows data to be acquired over a wide area of a TEM-specimen grid. Undesired drift in the hologram position, which may occur during the hologram acquisition, can be corrected in real time by automated detection of the interference-fringe region in an image. To demonstrate the usefulness of the developed automated hologram acquisition system, gold nanoparticles dispersed on a carbon foil were observed with a 1.2-MV atomic resolution holography electron microscope. The system could obtain 1024 holograms, which provided phase maps for more than 500 nanoparticles with a lateral resolution of 0.14 nm, in just 1 h. The observation results revealed an anomalous increase in mean inner potential for a particle size smaller than 4 nm. The developed automated hologram acquisition system can be applied to improve the precision of phase measurement by averaging many phase images, as demonstrated by single particle analysis for biological entities. Moreover, the system makes it possible to study electrostatic potential of catalysts and other functional nanoparticles at atomic resolution.

Identifiants

pubmed: 32115651
pii: 5770848
doi: 10.1093/jmicro/dfaa004
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

132-139

Informations de copyright

© The Author(s) 2020. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Auteurs

Yoshio Takahashi (Y)

Research & Development Group, Hitachi, Ltd, Hatoyama Saitama 350-0395, Japan.

Tetsuya Akashi (T)

Research & Development Group, Hitachi, Ltd, Hatoyama Saitama 350-0395, Japan.

Atsuko Sato (A)

Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka 819-0395, Japan.

Toshiaki Tanigaki (T)

Research & Development Group, Hitachi, Ltd, Hatoyama Saitama 350-0395, Japan.

Hiroyuki Shinada (H)

Research & Development Group, Hitachi, Ltd, Hatoyama Saitama 350-0395, Japan.

Yasukazu Murakami (Y)

Department of Applied Quantum Physics and Nuclear Engineering, Kyushu University, Fukuoka 819-0395, Japan.

Classifications MeSH