Automated acquisition of vast numbers of electron holograms with atomic-scale phase information.
atomic resolution
automated acquisition
electron holography
gold nanoparticle
mean inner potential
transmission electron microscope
Journal
Microscopy (Oxford, England)
ISSN: 2050-5701
Titre abrégé: Microscopy (Oxf)
Pays: England
ID NLM: 101595834
Informations de publication
Date de publication:
08 Apr 2020
08 Apr 2020
Historique:
received:
07
08
2019
revised:
23
01
2020
accepted:
04
02
2020
pubmed:
3
3
2020
medline:
3
3
2020
entrez:
3
3
2020
Statut:
ppublish
Résumé
An automated acquisition system for collecting a large number of electron holograms, to improve the statistical precision of phase analysis, was developed. A technique for shifting the electron beam in combination with stage movement allows data to be acquired over a wide area of a TEM-specimen grid. Undesired drift in the hologram position, which may occur during the hologram acquisition, can be corrected in real time by automated detection of the interference-fringe region in an image. To demonstrate the usefulness of the developed automated hologram acquisition system, gold nanoparticles dispersed on a carbon foil were observed with a 1.2-MV atomic resolution holography electron microscope. The system could obtain 1024 holograms, which provided phase maps for more than 500 nanoparticles with a lateral resolution of 0.14 nm, in just 1 h. The observation results revealed an anomalous increase in mean inner potential for a particle size smaller than 4 nm. The developed automated hologram acquisition system can be applied to improve the precision of phase measurement by averaging many phase images, as demonstrated by single particle analysis for biological entities. Moreover, the system makes it possible to study electrostatic potential of catalysts and other functional nanoparticles at atomic resolution.
Identifiants
pubmed: 32115651
pii: 5770848
doi: 10.1093/jmicro/dfaa004
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
132-139Informations de copyright
© The Author(s) 2020. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.