Synergistic enhancement in the microelectronic properties of poly-(dioctylfluorene) based Schottky devices by CdSe quantum dots.


Journal

Scientific reports
ISSN: 2045-2322
Titre abrégé: Sci Rep
Pays: England
ID NLM: 101563288

Informations de publication

Date de publication:
16 Mar 2020
Historique:
received: 23 09 2019
accepted: 01 03 2020
entrez: 18 3 2020
pubmed: 18 3 2020
medline: 18 3 2020
Statut: epublish

Résumé

This paper reports the potential application of cadmium selenide (CdSe) quantum dots (QDs) in improving the microelectronic characteristics of Schottky barrier diode (SBD) prepared from a semiconducting material poly-(9,9-dioctylfluorene) (F8). Two SBDs, Ag/F8/P3HT/ITO and Ag/F8-CdSe QDs/P3HT/ITO, are fabricated by spin coating a 10 wt% solution of F8 in chloroform and 10:1 wt% solution of F8:CdSe QDs, respectively, on a pre-deposited poly(3-hexylthiophene) (P3HT) on indium tin oxide (ITO) substrate. To study the electronic properties of the fabricated devices, current-voltage (I-V) measurements are carried out at 25 °C in dark conditions. The I-V curves of Ag/F8/P3HT/ITO and Ag/F8-CdSe QDs/P3HT/ITO SBDs demonstrate asymmetrical behavior with forward bias current rectification ratio (RR) of 7.42 ± 0.02 and 142 ± 0.02, respectively, at ± 3.5 V which confirm the formation of depletion region. Other key parameters which govern microelectronic properties of the fabricated devices such as charge carrier mobility (µ), barrier height (ϕ

Identifiants

pubmed: 32179797
doi: 10.1038/s41598-020-61602-1
pii: 10.1038/s41598-020-61602-1
pmc: PMC7075892
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

4828

Subventions

Organisme : Higher Education Commission, Pakistan (HEC)
ID : 10170/KPK/ NRPU/R&D/HEC/2017
Organisme : Universiti Kebangsaan Malaysia (National University of Malaysia)
ID : DCP-2017-006/2 (UKM)

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Auteurs

Fida Muhammad (F)

Department of Physics, Faculty of Physical and Numerical Sciences, Abdul Wali Khan University Mardan, Mardan, 23200, Khyber Pakhtunkhwa, Pakistan.
Electronics & Nanoscale Engineering, School of Engineering, University of Glasgow, Glasgow, G12 8QQ, UK.

Muhammad Tahir (M)

Department of Physics, Faculty of Physical and Numerical Sciences, Abdul Wali Khan University Mardan, Mardan, 23200, Khyber Pakhtunkhwa, Pakistan. tahir@awkum.edu.pk.
Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, 50603, Malaysia. tahir@awkum.edu.pk.

Muhammad Zeb (M)

Department of Physics, Faculty of Physical and Numerical Sciences, Abdul Wali Khan University Mardan, Mardan, 23200, Khyber Pakhtunkhwa, Pakistan.

Muttanagoud N Kalasad (MN)

Department of Physics, Davangere University, Davangere, 577 007, Karnataka, India.

Suhana Mohd Said (S)

Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, 50603, Malaysia.

Mahidur R Sarker (MR)

Department of Mechanical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, 50603, Malaysia.

Mohd Faizul Mohd Sabri (MFM)

Department of Mechanical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, 50603, Malaysia.

Sawal Hamid Md Ali (SHM)

Department of Electric, Electronics and System Engineering, Faculty of Engineering and Built Environment, Universiti Kebangsaan Malaysia, Bangi, 43600, Malaysia.

Classifications MeSH