Graphene bandgap induced by ferroelectric HfO


Journal

Nanotechnology
ISSN: 1361-6528
Titre abrégé: Nanotechnology
Pays: England
ID NLM: 101241272

Informations de publication

Date de publication:
17 Apr 2020
Historique:
pubmed: 20 3 2020
medline: 20 3 2020
entrez: 20 3 2020
Statut: ppublish

Résumé

Motivated by the need to open a bandgap in graphene, we show experimentally that the CMOS-compatible ferroelectric HfZrO substrate induces a bandgap of 0.18 eV in graphene monolayer, which allows top-gate graphene/HfZrO/SiO

Identifiants

pubmed: 32191931
doi: 10.1088/1361-6528/ab814b
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

275202

Auteurs

Mircea Dragoman (M)

National Institute for Research and Development in Microtechnology (IMT), Str. Erou Iancu Nicolae 126A, Voluntari 077190, Romania.

Classifications MeSH