Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy.


Journal

Physical review letters
ISSN: 1079-7114
Titre abrégé: Phys Rev Lett
Pays: United States
ID NLM: 0401141

Informations de publication

Date de publication:
13 Mar 2020
Historique:
received: 17 10 2019
accepted: 30 01 2020
entrez: 29 3 2020
pubmed: 29 3 2020
medline: 29 3 2020
Statut: ppublish

Résumé

We propose a new method to measure atomic scale dynamics of nanoparticles from experimental high-resolution annular dark field scanning transmission electron microscopy images. By using the so-called hidden Markov model, which explicitly models the possibility of structural changes, the number of atoms in each atomic column can be quantified over time. This newly proposed method outperforms the current atom-counting procedure and enables the determination of the probabilities and cross sections for surface diffusion. This method is therefore of great importance for revealing and quantifying the atomic structure when it evolves over time via adatom dynamics, surface diffusion, beam effects, or during in situ experiments.

Identifiants

pubmed: 32216442
doi: 10.1103/PhysRevLett.124.106105
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

106105

Auteurs

Annelies De Wael (A)

EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.

Annick De Backer (A)

EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.

Lewys Jones (L)

Department of Materials, University of Oxford, Parks Road, OX1 3PH Oxford, United Kingdom.
Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin 2, Ireland.
School of Physics, Trinity College Dublin, The University of Dublin, Dublin 2, Ireland.

Aakash Varambhia (A)

Department of Materials, University of Oxford, Parks Road, OX1 3PH Oxford, United Kingdom.

Peter D Nellist (PD)

Department of Materials, University of Oxford, Parks Road, OX1 3PH Oxford, United Kingdom.

Sandra Van Aert (S)

EMAT, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.

Classifications MeSH