Single Crystal Electrochemistry as an In Situ Analytical Characterization Tool.

adsorption cyclic voltammetry nanoparticles with preferential shapes platinum single crystal electrodes

Journal

Annual review of analytical chemistry (Palo Alto, Calif.)
ISSN: 1936-1335
Titre abrégé: Annu Rev Anal Chem (Palo Alto Calif)
Pays: United States
ID NLM: 101508602

Informations de publication

Date de publication:
12 06 2020
Historique:
pubmed: 4 4 2020
medline: 4 4 2020
entrez: 4 4 2020
Statut: ppublish

Résumé

The electrochemical behavior of platinum single crystal surfaces can be taken as a model response for the interpretation of the activity of heterogeneous electrodes. The cyclic voltammogram of a given platinum electrode can be considered a fingerprint characteristic of the distribution of sites on its surface. We start this review by providing some simple mathematical descriptions of the voltammetric response in the presence of adsorption processes. We then describe the voltammogram of platinum basal planes, followed by the response of stepped surfaces. The voltammogram of polycrystalline materials can be understood as a composition of the response of the different basal contributions. Further resolution in the discrimination of different surface sites can be achieved with the aid of surface modification using adatoms such as bismuth or germanium. The application of these ideas is exemplified with the consideration of real catalysts composed of platinum nanoparticles with preferential shapes.

Identifiants

pubmed: 32243760
doi: 10.1146/annurev-anchem-061318-115541
doi:

Types de publication

Journal Article Research Support, Non-U.S. Gov't

Langues

eng

Sous-ensembles de citation

IM

Pagination

201-222

Auteurs

Víctor Climent (V)

Instituto Universitario de Electroquímica, Universidad de Alicante, E-03690, San Vicente del Raspeig, Alicante, Spain; email: juan.feliu@ua.es.

Juan Feliu (J)

Instituto Universitario de Electroquímica, Universidad de Alicante, E-03690, San Vicente del Raspeig, Alicante, Spain; email: juan.feliu@ua.es.

Classifications MeSH