A sensitive and robust thin-film x-ray detector using 2D layered perovskite diodes.


Journal

Science advances
ISSN: 2375-2548
Titre abrégé: Sci Adv
Pays: United States
ID NLM: 101653440

Informations de publication

Date de publication:
Apr 2020
Historique:
received: 17 05 2019
accepted: 14 01 2020
entrez: 18 4 2020
pubmed: 18 4 2020
medline: 18 4 2020
Statut: epublish

Résumé

Solid-state radiation detectors, using crystalline semiconductors to convert radiation photons to electrical charges, outperform other technologies with high detectivity and sensitivity. Here, we demonstrate a thin-film x-ray detector comprised with highly crystalline two-dimensional Ruddlesden-Popper phase layered perovskites fabricated in a fully depleted

Identifiants

pubmed: 32300647
doi: 10.1126/sciadv.aay0815
pii: aay0815
pmc: PMC7148088
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

eaay0815

Informations de copyright

Copyright © 2020 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC).

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Auteurs

Hsinhan Tsai (H)

Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM 87544, USA.

Fangze Liu (F)

Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM 87544, USA.

Shreetu Shrestha (S)

Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM 87544, USA.

Kasun Fernando (K)

Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM 87544, USA.

Sergei Tretiak (S)

Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, USA.
Theoretical Division, Los Alamos National Laboratory, Los Alamos, NM 87544, USA.

Brian Scott (B)

Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM 87544, USA.

Duc Ta Vo (DT)

Nuclear Engineering and Nonproliferation, Los Alamos National Laboratory, Los Alamos, NM 87544, USA.

Joseph Strzalka (J)

X-Ray Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.

Wanyi Nie (W)

Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM 87544, USA.
Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, USA.

Classifications MeSH