Microscopic sensors using optical wireless integrated circuits.


Journal

Proceedings of the National Academy of Sciences of the United States of America
ISSN: 1091-6490
Titre abrégé: Proc Natl Acad Sci U S A
Pays: United States
ID NLM: 7505876

Informations de publication

Date de publication:
28 04 2020
Historique:
pubmed: 19 4 2020
medline: 26 8 2020
entrez: 19 4 2020
Statut: ppublish

Résumé

We present a platform for parallel production of standalone, untethered electronic sensors that are truly microscopic, i.e., smaller than the resolution of the naked eye. This platform heterogeneously integrates silicon electronics and inorganic microlight emitting diodes (LEDs) into a 100-μm-scale package that is powered by and communicates with light. The devices are fabricated, packaged, and released in parallel using photolithographic techniques, resulting in ∼10,000 individual sensors per square inch. To illustrate their use, we show proof-of-concept measurements recording voltage, temperature, pressure, and conductivity in a variety of environments.

Identifiants

pubmed: 32303653
pii: 1919677117
doi: 10.1073/pnas.1919677117
pmc: PMC7196798
doi:

Substances chimiques

Silicon Z4152N8IUI

Types de publication

Journal Article Research Support, N.I.H., Extramural Research Support, Non-U.S. Gov't Research Support, U.S. Gov't, Non-P.H.S.

Langues

eng

Sous-ensembles de citation

IM

Pagination

9173-9179

Subventions

Organisme : NEI NIH HHS
ID : R21 EY027581
Pays : United States
Organisme : NINDS NIH HHS
ID : UF1 NS107687
Pays : United States

Déclaration de conflit d'intérêts

Competing interest statement: A.J.C, S.L., A.C.M., and P.L.M. have filed a Patent Cooperation Treaty application that covers the work reported here (Provisional Patent Application 62/740,326).

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Auteurs

Alejandro J Cortese (AJ)

Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853.

Conrad L Smart (CL)

Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853.

Tianyu Wang (T)

Applied and Engineering Physics, Cornell University, Ithaca, NY 14853.

Michael F Reynolds (MF)

Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853.

Samantha L Norris (SL)

Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853.

Yanxin Ji (Y)

School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853.

Sunwoo Lee (S)

School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853.

Aaron Mok (A)

Applied and Engineering Physics, Cornell University, Ithaca, NY 14853.

Chunyan Wu (C)

Applied and Engineering Physics, Cornell University, Ithaca, NY 14853.

Fei Xia (F)

Applied and Engineering Physics, Cornell University, Ithaca, NY 14853.

Nathan I Ellis (NI)

Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853.

Alyosha C Molnar (AC)

School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853.
Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY 14853.

Chris Xu (C)

Applied and Engineering Physics, Cornell University, Ithaca, NY 14853.
Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY 14853.

Paul L McEuen (PL)

Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853; plm23@cornell.edu.
Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY 14853.

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Classifications MeSH