Elastic stubbed metamaterial plate with torsional resonances.


Journal

Ultrasonics
ISSN: 1874-9968
Titre abrégé: Ultrasonics
Pays: Netherlands
ID NLM: 0050452

Informations de publication

Date de publication:
Aug 2020
Historique:
received: 04 12 2019
revised: 24 03 2020
accepted: 29 03 2020
pubmed: 19 4 2020
medline: 19 4 2020
entrez: 19 4 2020
Statut: ppublish

Résumé

We report on a new mechanism involving the torsional resonance of stubs to achieve the negative effective shear modulus of an elastic metamaterial plate. Combined with a mechanism to create a negative mass density, we develop a general method to set up and enlarge a shear-horizontal-polarized double-negative branch in the elastic metamaterial plate with stubs on both sides. We explore the capabilities of this structure for polarization filtering, mode conversion and abnormal refraction. It is shown that, this metamaterial plate behaves divergently against the polarization of incident waves propagating along ΓX direction in a square lattice crystal: it behaves as a double-negative system for zero-order shear horizontal (SH

Identifiants

pubmed: 32304954
pii: S0041-624X(20)30081-0
doi: 10.1016/j.ultras.2020.106142
pii:
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

106142

Informations de copyright

Copyright © 2020 Elsevier B.V. All rights reserved.

Déclaration de conflit d'intérêts

Declaration of Competing Interest The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

Auteurs

Wei Wang (W)

Sorbonne Université, UPMC Université Paris 06 (INSP-UMR CNRS 7588), 4, place Jussieu, 75005 Paris, France.

Bernard Bonello (B)

Sorbonne Université, UPMC Université Paris 06 (INSP-UMR CNRS 7588), 4, place Jussieu, 75005 Paris, France. Electronic address: bernard.bonello@insp.jussieu.fr.

Bahram Djafari-Rouhani (B)

Institut d'Electronique, de Micro-électronique et de Nanotechnologie (IEMN-UMR CNRS 8520), Université de Lille Sciences et Technologies, Cité Scientifique, 59652 Villeneuve d'Ascq Cedex, France.

Yan Pennec (Y)

Institut d'Electronique, de Micro-électronique et de Nanotechnologie (IEMN-UMR CNRS 8520), Université de Lille Sciences et Technologies, Cité Scientifique, 59652 Villeneuve d'Ascq Cedex, France.

Jinfeng Zhao (J)

School of Aerospace Engineering and Applied Mechanics, Tongji University, 100 Zhangwu Road, 200092 Shanghai, China.

Classifications MeSH